Investigation of Optical and Electrical Properties of Pb(Zr_1-xTi_x)O₃ Thin Films on Different Substrates

Abstract

Pb(Zr1-xTix)O3 (PZT) polycrystalline thin films were prepared by sol–gel and pulsed laser deposition techniques on Pt/Ti/SiO2/Si (Pt) and SrRuO3/LaAlO3 (SRO/LAO) substrates. Infrared reflectivity spectroscopy with oblique (45°) light incidence revealed both the 3LO (688 cm-1) phonon lineshape asymmetry decrease with increasing in thickness and the thinner, disordered boundary layer at the SRO/PZT interface independently of the film preparation method. The fatigue properties of PZT films were studied for various crystallographic orientations. It was observed that in the 52/48 PZT/SRO/LAO film, when the field is applied along the (001) direction, excellent fatigue resistance is obtained.

Terahertz based optical & electrical properties of PZT

“…The bonds could get stretching, which is indicated the bond 1300-1400 cm -1 . While preparation of PZT nano powders, Deionized water used, hence H-O could have possible to exist in PZT powders even though annealed at different temperatures, this bond is around 3400 cm -1 and bending of H-O bond is around 1450 cm -1 [30][31][32][33][34][35][36].The above discussed modes were shown in Fig. 3.…”

Electrical properties of LaB 6 /PZT/Ag structure with asymmetric interface charge distribution

“…Principal among these is the mechanisms controlling current-voltage (I-V) characteristics for a given electrode material [3][4]. In the most studies of capacitors based on PZT employed noble metal (Pt, Au, Ag) or oxide (SrRuO 3 , ITO, La 0.5 Sr 0.5 CoO) electrodes [5][6][7][8]. Up until now, there have been no reports on PZT/LaB 6 system in which LaB 6 is used as electrode.…”