2016
DOI: 10.1016/j.sna.2016.02.014
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Investigation into the capabilities of Hall cells integrated in a non-fully depleted SOI CMOS technological process

Abstract: The behaviour of SOI Hall cells integrated in a non-fully depleted SOI ("Silicon-On-Insulator") CMOS technology is investigated, with an emphasis on the study of their main parameters. To meet these objectives, a particular optimum structure has been designed, integrated and subsequently analyzed. The performance evaluation of this Hall cells is carried out by means of both a threedimensional physical model and measurements. The Hall voltage, electrostatic potential distribution, space charge and sensitivity h… Show more

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Cited by 5 publications
(3 citation statements)
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References 18 publications
(25 reference statements)
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“…The process reported here involves commercial chips based on the XI10 technology available from X-FAB Semiconductor Foundries, which uses 1-μm design rules in a partially depleted SOI CMOS process originally designed for applications that demand stable operation at high temperatures (37,38). Completed 6-inch wafers, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The process reported here involves commercial chips based on the XI10 technology available from X-FAB Semiconductor Foundries, which uses 1-μm design rules in a partially depleted SOI CMOS process originally designed for applications that demand stable operation at high temperatures (37,38). Completed 6-inch wafers, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Several existing studies have investigated the temperature and power performances of SOI Hall sensors via experimental methods [ 8 , 9 ]. Some research has also adopted three-dimensional (3D) physical models to simulate the design optimization of SOI Hall cells [ 10 , 11 , 12 , 13 ]. Dolgyi et al [ 10 ] studied the dependencies of electric characteristics on the process parameters of SOI Hall sensors.…”
Section: Introductionmentioning
confidence: 99%
“…However, this research was limited to the analysis of electrical characteristics, such as current-voltage characteristics, the threshold voltage, and the breakdown voltage, and presented less discussion on the effects of bias, geometries, or other design parameters on sensitivity, offset voltage, and power consumption. Paun et al [ 13 ] analyzed the behavior of an optimum Hall cell in a partially depleted SOI (PD-SOI) fabrication process by constructing a 3D physical model of the structure and performing simulations; however, the SOI Hall sensor structure in this work did not use the FD state, and an analysis of gate and substrate voltage regulation was absent.…”
Section: Introductionmentioning
confidence: 99%