2020
DOI: 10.1109/ted.2020.3009623
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Investigating Ferroelectric Minor Loop Dynamics and History Effect—Part I: Device Characterization

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Cited by 23 publications
(9 citation statements)
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“…Unlike conventional Fe-FET that only has two states, the use of analog switching in ferroelectric material generates a range of intermediate states, which is beneficial for developing energy-efficient, high-density memory and synapse using FeFETs (Figure 1a). [27][28][29][30] The performance of FeFETs is significantly affected by the properties of the ferroelectric material, such as leakage current, interface trap density, memory window, C2C variation, retention, and endurance. [16][17][18][19][20] Therefore, it is crucial to establish a comprehensive understanding of the ferroelectric material used in the gate stack of the Fe-FET.…”
Section: Ferroelectric Switching Propertiesmentioning
confidence: 99%
“…Unlike conventional Fe-FET that only has two states, the use of analog switching in ferroelectric material generates a range of intermediate states, which is beneficial for developing energy-efficient, high-density memory and synapse using FeFETs (Figure 1a). [27][28][29][30] The performance of FeFETs is significantly affected by the properties of the ferroelectric material, such as leakage current, interface trap density, memory window, C2C variation, retention, and endurance. [16][17][18][19][20] Therefore, it is crucial to establish a comprehensive understanding of the ferroelectric material used in the gate stack of the Fe-FET.…”
Section: Ferroelectric Switching Propertiesmentioning
confidence: 99%
“…In addition, because the partially polarized states depend on the previous polarization state, the pulse induced to achieve targeted polarization states should be optimized while considering the history of polarization 83–85 . This is demonstrated using phase‐field modeling (PFM) based on the time‐dependent Landau–Ginzburg equation.…”
Section: Advantages and Challenges Of Fluorite‐structured Ferroelectr...mentioning
confidence: 99%
“…In addition, because the partially polarized states depend on the previous polarization state, the pulse induced to achieve targeted polarization states should be optimized while considering the history of polarization. [83][84][85] This is demonstrated using phase-field modeling (PFM) based on the time-dependent Landau-Ginzburg equation. Therefore, because variations in the Landau coefficient are caused by phase stability, the description of the history effect in domain dynamics depends on the polar/nonpolar phase stability.…”
Section: Advantages and Challenges Of Neuromorphic Computing Devicesmentioning
confidence: 99%
“…It consists of an additional ferroelectric layer of dopedhafnium oxide (HfZrO x ) in the gate stack. The polarizationstate of the ferroelectric layer dictates the threshold voltage and may be tuned with the help of electrical pulses applied at the gate and drain terminals [23], [26], [27]. HfZrO x -based ferroelectric FETs with a capability of tuning the weights (conductance states) with more than 5-bit precision have already been experimentally demonstrated [25], [27].…”
Section: Fe-finfet Structure and Modeling Approachmentioning
confidence: 99%
“…HfZrO x -based ferroelectric FETs with a capability of tuning the weights (conductance states) with more than 5-bit precision have already been experimentally demonstrated [25], [27]. In this work, we have utilized an experimentally calibrated compact model for Fe-FinFETs [28] which accurately captures the static polarization characteristics, program/erase behavior, temporal dynamics during transient analysis and the history effect of a HfZrO x stack [26]. The parameters of the compact model have been tuned to reproduce the experimental characteristics of the HfZrO x -based ferroelectric capacitor reported in [25] and shown in Fig.…”
Section: Fe-finfet Structure and Modeling Approachmentioning
confidence: 99%