2014
DOI: 10.1088/0022-3727/47/7/075102
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Interfacial insertion of a poly(3,4-ethylenedioxythiophene): poly(styrenesulfonate) layer between the poly(3-hexyl thiophene) semiconductor and cross-linked poly(vinyl alcohol) insulator layer in organic field-effect transistors

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Cited by 16 publications
(5 citation statements)
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“…7,8 Quite recently, it was demonstrated that the insertion of a very thin layer of low conductivity aged PEDOT:PSS (poly (3,4ethylenedioxythiophene):poly(styrenesulfonate)) treated with dimethyl sulfoxide, as a secondary doping agent, between the cr-PVA and the P3HT channel positively affects the FET performance due to trap action suppression. 9 Despite providing insights to control the traps promoted device characteristics degradation through a very thin shielding layer, aged PEDOT:PSS is not easily available and for this reason cannot be seen as a simple and largely applicable solution.…”
Section: Introductionmentioning
confidence: 99%
“…7,8 Quite recently, it was demonstrated that the insertion of a very thin layer of low conductivity aged PEDOT:PSS (poly (3,4ethylenedioxythiophene):poly(styrenesulfonate)) treated with dimethyl sulfoxide, as a secondary doping agent, between the cr-PVA and the P3HT channel positively affects the FET performance due to trap action suppression. 9 Despite providing insights to control the traps promoted device characteristics degradation through a very thin shielding layer, aged PEDOT:PSS is not easily available and for this reason cannot be seen as a simple and largely applicable solution.…”
Section: Introductionmentioning
confidence: 99%
“…This dipole is fully developed when the CuPc film is 2.2 nm thick, which produces a −0.8 eV lowering of the PEDOT work function. As we are using aged PEDOT:PSS , the expected lower bipolaron population and the smaller electric conductivity of our material can produce a lower polarization of this film. Yet this dipole formation should in principle be present, leading to variations of the threshold voltage of the transistor upon insertion of the PEDOT:PSS layer, a fact that was indeed observed in our measurements.…”
Section: Resultsmentioning
confidence: 99%
“…Details regarding aged PEDOT characterization and PEDOT modification by dimethyl sulfoxide addition are given in Ref. ). CuPc (30 nm thick) was evaporated onto the Al/cr‐PVA or Al/cr‐PVA/PEDOT at ∼1 nm s −1 .…”
Section: Methodsmentioning
confidence: 99%
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“…Therefore, the mobility and operational stability depend on the hydrophobicity of the dielectric layer than the morphology of the semiconductor. Strategies to reduce the trap states, like the insertion of polystyrene sulfonate (PEDOT: PSS) between the semiconductor layer and the gate dielectric layer, resulting in both reduction of trap states at the interface of the semiconductor and the dielectric layer and an improvement of carrier mobility . Cristiane de Col et al demonstrated the application of an environmentally friendly aqueous solution of ascorbic acid (vitamin C) at the interface of the semiconductor layer and the gate dielectric layer to passivate the positively charged defects present on the surface of cross‐linked poly(vinylalcohol) gate dielectric and significant improvement of device performance was achieved .…”
Section: Resultsmentioning
confidence: 99%