2022
DOI: 10.1016/j.renene.2021.11.065
|View full text |Cite
|
Sign up to set email alerts
|

Interface and material properties of wide band gap a-SiCx:H thin films for solar cell applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
7
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(8 citation statements)
references
References 31 publications
1
7
0
Order By: Relevance
“…Increasing the number of C atoms breaks the Si crystalline pattern, forming C–C diamond-like bonds [ 105 ], and thus increasing the resistivity. Loulou et al’s [ 102 ] and Donercark et al’s [ 58 ] results are consistent with Du et al [ 110 ] across their respective ranges (see Figure 4 ).…”
Section: Controlling A-sic Film Properties For Pecvdsupporting
confidence: 86%
See 2 more Smart Citations
“…Increasing the number of C atoms breaks the Si crystalline pattern, forming C–C diamond-like bonds [ 105 ], and thus increasing the resistivity. Loulou et al’s [ 102 ] and Donercark et al’s [ 58 ] results are consistent with Du et al [ 110 ] across their respective ranges (see Figure 4 ).…”
Section: Controlling A-sic Film Properties For Pecvdsupporting
confidence: 86%
“…Three studies [ 58 , 79 , 115 ] have examined the variation of the optical bandgap with stoichiometry ( Figure 6 ), finding a decrease in the bandgap as the Si content increases. Mastelaro et al [ 116 ] attribute the previous trend to the formation of diamond-like C–C bonds at high C content rather than to voids due to hydrogen inclusion and the formation of microvoids.…”
Section: Controlling A-sic Film Properties For Pecvdmentioning
confidence: 99%
See 1 more Smart Citation
“…The optical band gap of a-SiC x :H(i) can be expanded to 4 eV at high methane concentrations [79], which reduces optical absorption loss in the passivation layer [80]. However, at the a-SiC x :H(i)/c-Si interface, high interface trap density was observed with high carbon atomic concentrations [81]. Ehling et al [82] demonstrated that a low carbon content ([CH 4 ]/[(CH 4 ) + (SiH 4 )]) of 1.3% was associated with a higher lifetime value.…”
Section: Chemical Passivationmentioning
confidence: 99%
“…The resulting decrease in hydrogen atoms at the a-SiC:H(i)/c-Si interface leads to a decrease in the passivation quality [82]. Donercark et al [81] proposed the use of a stacked structure using a-Si:H(i) and a-SiC x :H(i) to improve the quality of interface passivation while ensuring that the large band gap a-SiC x :H(i) was leveraged to reduce optical absorption loss. The incorporation of carbon into a-SiC:H results in the formation of structural defects and inhomogeneities, leading to disorder in amorphous networks.…”
Section: Chemical Passivationmentioning
confidence: 99%