Interdisciplinary surface studies on porous silicon (PSi)—II. Cathodoluminescence (CD, Auger (AES), electron energy loss (EELS) and Raman spectroscopy of different PSi samples

Jardin, C.; Gruzza, B.; Vázsonyi, É.; Gergely, György

doi:10.1016/0042-207x(94)00115-4

Cited by 5 publications

(1 citation statement)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Briefly, most of the corresponding works were dedicated to the assignment of the origin of the CL emissions and ascribed the higher energy emissions to bulk SiO x defects [2][3][4][5][6]. Some reports suggested that the red CL emission is due to black body radiation caused by the heating of the material during the electron irradiation [7]. This possibility was excluded in samples that were well connected thermally to a heat dissipating substrate [8].…”

Section: Introductionmentioning

confidence: 99%

Tuning the cathodoluminescence of porous silicon films

Biaggi-Labiosa¹,

Fonseca²,

Resto³

et al. 2008

Journal of Luminescence

View full text Add to dashboard Cite

Section: Introductionmentioning

confidence: 99%

Tuning the cathodoluminescence of porous silicon films

Biaggi-Labiosa¹,

Fonseca²,

Resto³

et al. 2008

Journal of Luminescence

View full text Add to dashboard Cite

Polarization effects on the Raman and photoluminescence spectra of porous silicon layers

Salcedo

Fernandez

Rubim

1999

J. Raman Spectrosc.

View full text Add to dashboard Cite

The e †ect of di †erent polarization orientations of the excitation source on the Raman and photoluminescence (PL) spectra of a porous silicon (PS) layer within two di †erent micro-regions was investigated. Two micro-regions (2 lm) along the (100) direction were studied, close to the crystalline silicon (c-Si)-PS layer interface and the PS layer-air interface. The Raman depolarization factors obtained in the 100-1200 cm-1 phonon spectra of these two micro-regions showed that the anisotropy presented by the PS layer is similar to that presented by the c-Si (100). Large di †erences in the Raman linewidths and di †erent emission maxima in the PL spectra were observed for the two micro-regions. These results were interpreted as the PS layer being inhomogeneous along the (100) direction. These e †ects are discussed from a critical point of view by taking into account quantum conÐnement and chemical composition of the nano-crystallite surface, since the stretching mode was also observed in the Raman SiH 2 spectra. Excitation with di †erent polarizations causes a shift of the emission maxima. This shift was assigned to a polarization dichroism caused by a breakdown on the degeneracy as the nano-crystallites having a reduced symmetry in relation to c-Si. The results strongly support the hypothesis that the luminescence presented by the PS layer is due to the presence of Si-based compounds on the surface of Si nanocrystallites.

show abstract