Interaction domains in high-performance NdFeB thick films

Woodcock, T.G.; Khlopkov, K.; Walther, Arnaud; Dempsey, Nora; Givord, D.; Schultz, L.; Gutfleisch, Oliver

doi:10.1016/j.scriptamat.2009.01.028

Cited by 42 publications

(15 citation statements)

References 26 publications

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“…Moreover, the analysis of the relative intensities of the observed rings exhibits the presence of (0002) texture where the hexagonal axis is preferentially oriented perpendicularly to the film surface [31]. Nevertheless, to get a deeper insight into the crystallographic orientation of the films, it is necessary to apply more sensitive techniques, such as X-ray diffraction (XRD) Θ-2Θ spectra, [12,28,29], the X-ray Schulz pole figures [12,32], or the electron backscattered diffraction (EBSD) method [33,34]. These measurements are planned in near future.…”

Section: Resultsmentioning

confidence: 99%

Investigation of thermally evaporated nanocrystalline thin cobalt films

et al. 2017

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structures are of large importance. From the practical point of view, they are very significant for tailoring of the specimens with the required properties. In particular, they allow to develop high-density magnetic and magneto-optic recording media, modern recording heads, high-performance permanent magnets, magnetic sensors, and transformer steel sheets [1,2]. The knowledge of the magnetic domain behavior in relation to the morphological structure of the specimens is also important for theoretical modeling of magnetic properties [1,2].Thin magnetic films attract large attention from the fundamental as well as technological point of view. On the fundamental side, they exhibit different magnetic properties, such as magnetic anisotropy [3], magnetic microstructure [4], coercivity [5], and magnetoresistance [6], depending on their thickness, composition, crystalline structure, and preparation conditions. From the technological point of view, thin magnetic films have a number of applications; for example, they are used in magnetic information storage media, magneto-optic recording media, magnetic devices, and sensors [1,2].In particular, cobalt thin films have been the subject of wide and intense study in recent years. They can be prepared by various techniques, for example by sputtering, thermal evaporation, electron beam evaporation, molecular beam epitaxy, pulsed laser deposition, electrodeposition, and chemical vapor deposition [7][8][9]. The obtained films are usually nanocrystalline in nature and possess specific, improved mechanical, physical, magnetic, and chemical properties in comparison with conventional microcrystalline counterparts. Depending on the film thickness as well as the preparation method and conditions used, cobalt thin films exhibit a wide range of morphological and magnetic properties, and especially various magnetic domain structures with inplane and outofplane magnetization [10][11][12][13]. AbstractIn this paper, a study has been made of nanocrystalline thin cobalt films with thicknesses in the range from 10 to 60 nm. The films were thermally evaporated at incidence angle of 0° in a vacuum of about 10 − 5 mbar. The morphological structure of the films consists of nanocrystalline grains regular in shape and densely packed. As the film thickness is increased from 10 to 60 nm, the average grain size increases from 22.0 to 28.9 nm. The films crystallize mainly in the hexagonal close-packed phase of cobalt. The magnetic structure is composed of domains. In films with thicknesses in the range from 10 to 40 nm, the domains are magnetized in the plane of the film, while films with thicknesses of 50 and 60 nm possess both inplane and perpendicular magnetization components. The domains with inplane magnetization are irregular in shape and typically from a few to 10 mm in size, whereas the domains with perpendicular magnetization form a fine maze stripe pattern of the order of 100 nm in width.

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Section: Resultsmentioning

confidence: 99%

Investigation of thermally evaporated nanocrystalline thin cobalt films

et al. 2017

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“…We deliberately do not use the term domain wall since the border is not a domain wall in a classical way by means of micromagnetism [17]. It has been shown before that the border between interaction domains of opposite polarization follows the grain boundaries [14,19]. To prove this in the case of the sample shown here an imaging method with a much higher resolution than Kerr microscopy would be needed as provided by e.g.…”

Section: Magnetic Domain Investigationsmentioning

confidence: 99%

Magnetization reversal in textured NdFeB–Fe composites observed by domain imaging

Thielsch

Hinz

Schultz

et al. 2010

Journal of Magnetism and Magnetic Materials

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“…This is particularly relevant for characterizing the domain pattern of the fine grained structures produced in certain bulk materials (e.g. melt-spun ribbons [12], hot-deformed magnets [13]) and films [14][15][16]. In the case of film samples, Corresponding author: O. Fruchart (email: Olivier.Fruchart@cea.fr).…”

Section: Introductionmentioning

confidence: 99%

Some Aspects of Magnetic Force Microscopy of Hard Magnetic Films

et al. 2016

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A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever stiffness usual for MFM (1−4 N/m), contain artifacts due to strong probe-sample interactions which lead to probe retraction. As a result, stiffer cantilevers (e.g. 40 N/m) are better adapted to characterizing such hard magnetic films. Secondly, imaging with probes coated by a hard magnetic film leads to phase maps which show a two-fold symmetry, with paired dark/light contrast on opposite domain edges along the direction of the cantilever. We analyze quantitatively this effect, due to the tilt of the direction of tip magnetization and direction of oscillation, with respect to the sample normal. Thirdly, due to the long-range nature of the stray field produced by hard magnetic films containing micron-sized domains, MFM phase contrast reflects the stray field itself, as opposed to that of its spatial derivatives, as is generally the case in MFM.

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Interaction domains in high-performance NdFeB thick films

Cited by 42 publications

References 26 publications

Investigation of thermally evaporated nanocrystalline thin cobalt films

Investigation of thermally evaporated nanocrystalline thin cobalt films

Magnetization reversal in textured NdFeB–Fe composites observed by domain imaging

Some Aspects of Magnetic Force Microscopy of Hard Magnetic Films

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