2022
DOI: 10.1016/j.solmat.2022.111975
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Integration of thin n-type nc-Si:H layers in the window-multilayer stack of heterojunction solar cells

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Cited by 7 publications
(4 citation statements)
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“…where KT/q is thermal voltage = 0.025 eV, J sc = short circuit current density and J 0 = total saturation current density. An enhancement in the EQE also confirms the c-Si passivation quality for the nanocrystalline sample [21], which can be correlated to an increase in the diffusion length of the minority carriers and better collection from the rear side (J sc enhancement) compared to the n-a-Si:H layer. The c-Si surface passivation enhancement can be attributed to the chemical passivation with additional hydrogen (during nc-Si deposition) and field-effect passivation due to efficient doping in the nc-Si:H phase.…”
Section: Layerssupporting
confidence: 53%
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“…where KT/q is thermal voltage = 0.025 eV, J sc = short circuit current density and J 0 = total saturation current density. An enhancement in the EQE also confirms the c-Si passivation quality for the nanocrystalline sample [21], which can be correlated to an increase in the diffusion length of the minority carriers and better collection from the rear side (J sc enhancement) compared to the n-a-Si:H layer. The c-Si surface passivation enhancement can be attributed to the chemical passivation with additional hydrogen (during nc-Si deposition) and field-effect passivation due to efficient doping in the nc-Si:H phase.…”
Section: Layerssupporting
confidence: 53%
“…The transition from the amorphous to the nanocrystalline phase depends on phosphorous doping concentration, along with the H 2 /SiH 4 ratio [20]. The phosphorous-doping fraction increases to 4%, which may cause a thicker nucleation zone (initial layer) and delayed crystal growth due to disruption in the periodicity of crystal lattice retarding the nc-Si: H layer growth [21].…”
Section: Resultsmentioning
confidence: 99%
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“…Strategies to achieve this have been developed leading to excellent cell performance on both sides contacted [3,4] and interdigitated back-contacted SHJ devices [5,6]. Here we report on developments of nc-Si layers, the impact of deposition temperature (Tdep) and the necessity for an ultra-thin oxide layer (SiOx) at the interface between a-Si(i) and the doped nc-Si layer for application of nc-Si in full-area M2 SHJ devices.…”
Section: Introductionmentioning
confidence: 99%