Field-programmable gate arrays (FPGA) based on static random access memory (SRAM) are more common than other types, including flash and anti-fuse because of their infinite configurability and high performance. However, following the scaling down of CMOS technology, standby power of the CMOS circuits are becoming crucial. Logic circuits based on magnetic RAM (MRAM) can be attractive replacement for the SRAM-based logics thanks to their zero leakage and CMOS compatibilities. Furthermore, in FPGA design, using MRAM logic instead of SRAM logic results in some more advantages including non-volatility and high radiation reliability. In this paper, effects of radiation induced soft errors on MRAM-based FPGAs (MFPGA) is taken into account. Soft error tolerance of the previous MFPGAs are discussed and a new MFPGA structure is proposed. It is shown that, the proposed non-volatile, low power and high speed MFPGA is highly robust against radiation induced soft errors. It also is shown that, the proposed MFPGA offering a high radiation robustness does not incur a considerable design overhead comparing with the other similar MFPGAs.