2001
DOI: 10.1109/41.915405
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Integrated sensor and electronic circuits in fully depleted SOI technology for high-temperature applications

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Cited by 20 publications
(8 citation statements)
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“…7, it is found that S R varies from S Rmax = 56 T -1 to S Rmin = 18 T -1 in the B y range from 1 to 30 mT, respectively. Although predicted from simulation, it is still 40 to 50 times higher than the sensitivity found in conventional MAGFETs, (6)(7)(8) indicating the good potential of the new magnetic sensor design. It is also important to emphasize that the sensitivity of the DG SDS MAGFET depends on the particular device geometry and chosen SOI technology parameters.…”
Section: Sensitivity Simulation and Discussionmentioning
confidence: 90%
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“…7, it is found that S R varies from S Rmax = 56 T -1 to S Rmin = 18 T -1 in the B y range from 1 to 30 mT, respectively. Although predicted from simulation, it is still 40 to 50 times higher than the sensitivity found in conventional MAGFETs, (6)(7)(8) indicating the good potential of the new magnetic sensor design. It is also important to emphasize that the sensitivity of the DG SDS MAGFET depends on the particular device geometry and chosen SOI technology parameters.…”
Section: Sensitivity Simulation and Discussionmentioning
confidence: 90%
“…(4,5) Thus, the design of MAGFETs in FD SOI technology has copied the layout of long-gate split-drain MAGFETs originally designed for bulk CMOS technology. (6)(7)(8) It is observed that MAGFETs in FD SOI technology have low magnetic sensitivities similar to their bulk CMOS counterparts falling in the range of (0.05-1.5) T -1 . (6)(7)(8) This limited magnetic sensitivity of conventionally designed bulk or FD SOI MAGFETs is predominantly caused by the low mobility of their carriers transported through the MOS surface channel, which is known to be more than twofold lower than the mobility of bulk carriers.…”
Section: Introductionmentioning
confidence: 99%
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“…It is evident from the figure that the transconductance efficiency (g m /I d ) decreases with increasing temperature. Meanwhile, the voltage gain and the unity gain bandwidth of the amplifier are directly related to the transconductance efficiency [13]. Therefore, the inversion coefficient is utilized to predict the performance of the amplifier at elevated temperatures.…”
Section: Voltage Regulatormentioning
confidence: 99%
“…SOI also provides improved latch-up immunity which ultimately increases the reliability of the circuit operation at higher temperatures. These features make SOI-based integrated circuits capable of operating successfully in the temperature range of 200-350°C [13] which is well above the range of conventional bulk silicon-based devices. In our work, a process that combines the advantages of high-voltage devices with SOI technology is chosen for the design and implementation of the high-temperature circuits.…”
Section: Introductionmentioning
confidence: 96%