2013
DOI: 10.1016/j.egypro.2013.07.260
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Inline Bulk-lifetime Prediction on as-cut Multicrystalline Silicon Wafers

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Cited by 8 publications
(2 citation statements)
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“…The emitter saturation current at the front and the back surfaces characterize the recombination of the front and the back diffusion regions respectively. In silicon with diffused emitter, effective minority carrier lifetime could be expressed as (Mankad et al, 2013) …”
Section: Resultsmentioning
confidence: 99%
“…The emitter saturation current at the front and the back surfaces characterize the recombination of the front and the back diffusion regions respectively. In silicon with diffused emitter, effective minority carrier lifetime could be expressed as (Mankad et al, 2013) …”
Section: Resultsmentioning
confidence: 99%
“…The positive effects of compensation on recombination are discussed by Coletti et al[81], as well as the concept of using compensation to produce heavily doped feedstocks for solar cell and the accompanying problems of no uniform resistivity profiles along compensated mc-Si ingots.The partially bonded Si atoms at the surface, called as dangling bonds, induces an almost continuous band of defect levels within the energy band gap. This problem is referred as surface recombination velocities (SRV)[34].The lifetime of minority charge carriers measures indicates the electrical performance in a silicon solar cell[84]. The lifetime, especially in bulk silicon, represents an important parameter of the electronic material, which strongly affects the voltage and maximum current output of a solar cell[24].…”
mentioning
confidence: 99%