2016
DOI: 10.1016/j.msea.2016.08.045
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Initial texture effects on the thermal stability and grain growth behavior of nanocrystalline Ni thin films

Abstract: Nanocrystalline Ni thin films with different as-deposited textures were synthesized by varying the substrate temperature during pulsed-laser deposition. The influence of initial texture variations on the thermal stability and annealing behavior of the thin films was studied via in situ transmission electron microscopy annealing and transmission Kikuchi diffraction analysis. It was found that, as the substrate temperature during deposition was increased, the initial microstructure varied from a random distribut… Show more

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Cited by 16 publications
(11 citation statements)
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“…Film texture has also been demonstrated to augment thermal stability in nanocrystalline nickel thin films by locally constraining grain growth and in turn, producing bimodal grain size distributions 57 that are similar to the grain structures observed in the nanocrystalline tungsten thin films. To probe the effect of crystallographic orientation through the abnormal and continuous growth regimes, grain orientation and combined reliability-orientation maps were acquired at temperatures of 300, 450, and 650°C via PED and are depicted in Figs.…”
Section: Fig 6 Inverse Pole Figures For the Combined Reliability-ormentioning
confidence: 88%
“…Film texture has also been demonstrated to augment thermal stability in nanocrystalline nickel thin films by locally constraining grain growth and in turn, producing bimodal grain size distributions 57 that are similar to the grain structures observed in the nanocrystalline tungsten thin films. To probe the effect of crystallographic orientation through the abnormal and continuous growth regimes, grain orientation and combined reliability-orientation maps were acquired at temperatures of 300, 450, and 650°C via PED and are depicted in Figs.…”
Section: Fig 6 Inverse Pole Figures For the Combined Reliability-ormentioning
confidence: 88%
“…Thermally-induced grain growth has been supported by the majority of experimental results so far [13][14][15][16][17][18][19][20][21][22][23][24][25][26]. A short summary of the grain size evolution during isothermal annealing of bulk electrodeposited NC Ni and Ni-Fe alloys is given in Table 1.…”
Section: Thermally-induced Grain Growthmentioning
confidence: 72%
“…In order to facilitate the observation, we only give the atomic distribution at the interface. 35,36 In order to investigate the stability of (001) SrHfO 3 /GaAs interface, we also calculate the interface binding energy, which is defined as 37…”
Section: Resultsmentioning
confidence: 99%