2001
DOI: 10.1016/s0040-6090(00)01589-3
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Influence of the process parameters on structural and electrical properties of r.f. magnetron sputtering ITO films

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Cited by 34 publications
(19 citation statements)
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“…It is already known that transmittance of the transparent conducting film depends on the concentration of oxygen in the film [19]. Films with greater oxygen concentration will be more transparent because it has higher band gap [19]. In the present case, there is possibility of increase in oxygen content with ion irradiation.…”
Section: Optical Studiesmentioning
confidence: 64%
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“…It is already known that transmittance of the transparent conducting film depends on the concentration of oxygen in the film [19]. Films with greater oxygen concentration will be more transparent because it has higher band gap [19]. In the present case, there is possibility of increase in oxygen content with ion irradiation.…”
Section: Optical Studiesmentioning
confidence: 64%
“…Due to increase in band gap of pristine to irradiated sample up to 3 Â 10 12 ion/cm 2 from 3.5 eV to 3.8 eV causing increase in transmittance and beyond this fluence again band gap decreases to 3.7 eV causing decrease in transmittance again. It is already known that transmittance of the transparent conducting film depends on the concentration of oxygen in the film [19]. Films with greater oxygen concentration will be more transparent because it has higher band gap [19].…”
Section: Optical Studiesmentioning
confidence: 99%
“…reported that higher percentage oxygen admixture (more than 10%) during sputtering promotes the growth of (440) peak and reduce the intensity of (400) peaks [9].…”
Section: Resultsmentioning
confidence: 99%
“…SEM and XRD results indicated that laser annealing coupled with the external magnetic field gave rise to gradually increased compactness and grain size of these corresponding films. Since the compactness is conducive to the conductivity of the films [46,47], and larger grain size results in less carrier scattering at grain boundaries and higher carrier mobility [48], the decrease in sheet resistance can thus be explained. The ML-Ni/FTO (1.0 J/cm 2 ) and ML-Ni/FTO (1.1 J/cm 2 ) films possessed a sheet resistance of 5.9 and 10.6 /sq, respectively, higher than that of the ML-Ni/FTO (0.9 J/cm 2 ) film, which should be related to the conglomeration of the particles and removing of the Ni layer in local regions as well as the increase in surface roughness of the films [49] as shown in Fig.…”
Section: Crystal Structurementioning
confidence: 99%