2014
DOI: 10.1016/j.ceramint.2013.06.020
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Influence of substrate temperature on the properties of CeO2 thin films by simple nebulizer spray pyrolysis technique

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Cited by 60 publications
(15 citation statements)
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“…The preferred orientation of the films can be confirmed by the higher value of texture coefficient. The increased number of grains along the plane associates the increase in preferred orientations [34]. The dislocation density (ı) defined as length of dislocation lines per unit volume of the crystal using crystallite size values (D) has been calculated using the Williamson and Smallman's formula [35]…”
Section: Structural Analysismentioning
confidence: 99%
“…The preferred orientation of the films can be confirmed by the higher value of texture coefficient. The increased number of grains along the plane associates the increase in preferred orientations [34]. The dislocation density (ı) defined as length of dislocation lines per unit volume of the crystal using crystallite size values (D) has been calculated using the Williamson and Smallman's formula [35]…”
Section: Structural Analysismentioning
confidence: 99%
“…where, D is the crystallite size, k is the shape factor (0.94) λ is wavelength of the X-ray (1.5406Å) and β is the full width at the half-maximum of the peaks selected The calculated crystalline size of the sprayed Co 3 O 4 thin films are given in Table 1 [17].…”
Section: -Ray Diffraction Analysismentioning
confidence: 99%
“…Among these techniques the NSP technique has many advantages such as low cost, easy to handle, convenient for large area deposition, uniform film deposition and less deposition time. This technique has been employed by many researchers to fabricate the films of tin oxide [16], cerium oxide [17], zinc oxide [18] and indium oxide [19]. Until now this technique has not been employed by researchers to prepare cobalt oxide thin films.…”
Section: Introductionmentioning
confidence: 97%
“…The oxygen partial pressure plays vital role in determining the preferred orientation of Gd doped ceria thin films. To know the growth of the Gd doped ceria thin films along the preferred orientation, it is essential to calculate texture coefficient (TC) for (hkl) plane [30]. Texture coefficient is determined for (2 0 0) plane using the following equation.…”
Section: X-ray Diffractionmentioning
confidence: 99%