2020
DOI: 10.3390/electronics9122164
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Influence of Structural Defects on the Resistivity and Current Flow Field in Conductive Thin Layers

Abstract: The paper presents an analysis of the influence of microcracks in textronic conductive layers on their conductive properties. The tested structures were created in the physical vacuum deposition process. The paper presents the results of computer simulations of the current flow field in thin conductive stripes with defects distributed along a line perpendicular to the stripe axis and randomly placed on its entire surface. It was found, inter alia, that a larger number of shorter collinear defects may have many… Show more

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Cited by 4 publications
(5 citation statements)
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“…To solve it, the method of integral equations was used. Its detailed description and algorithm are presented in [ 34 , 35 ].…”
Section: Methodsmentioning
confidence: 99%
“…To solve it, the method of integral equations was used. Its detailed description and algorithm are presented in [ 34 , 35 ].…”
Section: Methodsmentioning
confidence: 99%
“…The vector potential of the field originating from the uniformly distributed current flowing on the surface S0 is obtained by integrating (8) with respect to x0:…”
Section: Solution Methodsmentioning
confidence: 99%
“…Electroconductive thin films can be produced via various methods, such as physical vacuum deposition (PVD) [8,9], chemical vapor deposition (CVD) [10], electrochemical deposition [11], spin-coating [12], sol-gel technology [13][14][15], magnetron sputtering [16], ink-jet printing [17,18], screen printing [19] or electrospinning [20]. The development of new applications based on flexible and wearable devices with large surface areas requires thin-film electronics that can be fabricated using solvent methods.…”
Section: Introductionmentioning
confidence: 99%
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