1991
DOI: 10.1016/0166-6622(91)80088-6
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Influence of strontium on monofluorophosphate uptake by hydroxyapatite XPS characterization of the hydroxyapatite surface

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Cited by 41 publications
(15 citation statements)
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“…A later study by Stranick and Root [1991] suggested the formation of a surface apatitic phase with a Sr:Ca ratio of 3.4:6.6 and an increase in surface SrFAp formation with increasing [Sr]. Investigations into the metastable equilibrium solubility (MES) behavior of carbonated HAp by Heslop et al [2004Heslop et al [ , 2005 supported earlier investigations by Dedhiya et al [1973], but only for solution Sr:Ca ratios > 1.5.…”
Section: Sr and Capisupporting
confidence: 66%
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“…A later study by Stranick and Root [1991] suggested the formation of a surface apatitic phase with a Sr:Ca ratio of 3.4:6.6 and an increase in surface SrFAp formation with increasing [Sr]. Investigations into the metastable equilibrium solubility (MES) behavior of carbonated HAp by Heslop et al [2004Heslop et al [ , 2005 supported earlier investigations by Dedhiya et al [1973], but only for solution Sr:Ca ratios > 1.5.…”
Section: Sr and Capisupporting
confidence: 66%
“…Earlier investigations by Featherstone et al [1981] postulated that Sr (or Zn) is incorporated into Cadeficient areas of enamel, which were related to carbonate inclusion. LeGeros et al [1988] showed that the simultaneous presence of F and Sr will negate the otherwise negative impact of Sr on the formation and stability of HAp, presumably due to simultaneous substitution of Sr for Ca and of F for OH [LeGeros et al, 1977;Stranick and Root, 1991]. It has also been reported that greater Sr HAp incorporation is possible in the presence of F [LeGeros et al, 1988] or monofluorophosphate [Stranick and Root, 1991].…”
Section: Sr and Capimentioning
confidence: 95%
“…For FHA, an F 1s peak was obvious in the wide scan at $684 eV, which is the ngerprint for uorine in the FHA structure. 44 An Si 2p peak was evident in the narrow scan at $102 eV, which is the ngerprint for silicon in the SiHA structure. Moreover, the contents of Ca, F, Si and P in the materials were determined by the ratio of the area under the respective elemental peak in the XPS narrow scan spectrum; the results are presented in Table 2.…”
Section: Resultsmentioning
confidence: 93%
“…A discrepancy is observed between the ideal F À incorporation and the measured F À incorporation, especially at high concentrations, which is attributed to the loss of fluorine in the form of n-CaF 2 during the reaction process [30]. XPS narrow scan reveals only one peak located at 684.2 eV belonging to F 1s which is the fingerprint of F À in the FHAp or FA structure [31,32], indicating that fluoride ions have been successfully incorporated into the HAp lattice structure. In Fig.…”
Section: Structural Analysesmentioning
confidence: 91%