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Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x-ray photoelectron spectroscopy has been used to obtain comparison spectra of a high purity SnO2 powder. Due to rather small core level chemical shifts, it has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO using XPS [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence band peak is also characteristic of Sn oxides [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. The valence band spectrum and the valence band–Sn 4d separation reported in this work are consistent with literature data [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys., Rev. B 46, 2460 (1992); P. M. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. Auger parameter data may also prove useful for distinguishing between various tin compounds on surfaces. Thus, in addition to core level spectra, valence band and x-ray excited Auger spectra for SnO2 are presented. Data were obtained with a Perkin-Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation.

Tin and various tin compounds have wide utility in coatings, electronics, and catalysts, as well as having numerous biological applications. Distinguishing between different tin compounds on surfaces is an important aspect of research in many of these disciplines. In this work, x-ray photoelectron spectroscopy has been used to obtain comparison spectra of a SnO powder. The SnO powder was generated by grinding ~150 μm granules of SnO in a mortar and pestle. Grinding is necessary because surface oxidation of the SnO granules occurs producing a SnO2 shell. It has been shown that differences in the valence band spectra provide the most direct method of distinguishing between SnO2 and SnO [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992); P. M. A. Sherwood, ibid. 41, 10151 (1990); and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)]. The separation between the Sn 4d core level line and the most intense Sn valence peak is also characteristic of Sn oxides [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992) and P. M. A. Sherwood, ibid. 41, 10151 (1990)]. In the present study, identification of the powder as SnO after grinding was verified by comparison of the measured XPS valence band spectrum with published spectra [J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992) and C. L. Lau and G. K. Wertheim, J. Vac. Sci. Technol. 15, 622 (1978)] and by the XPS Sn:O atomic ratio. The valence band–Sn 4d separation is also consistent with that determined for SnO [see J-M. Themlin, M. Chtaib, L. Henrard, P. Lambin, J. Darville, and J-M. Gilles, Phys. Rev. B 46, 2460 (1992)]. Core level, valence band and x-ray excited Auger spectra for the SnO powder are presented. Data were obtained with a Perkin-Elmer Physical Electronics model 5600 photoelectron spectrometer using monochromatic radiation.

Manganese compounds have many applications in areas such as catalysis, electrochemistry, and metallurgy, among others. Distinguishing between the various chemical states of manganese is an important aspect of research in many of these areas. It has been shown that the different chemical states of manganese can be identified with XPS through the Mn 2p3/2 peak positions, Mn 2p1/2 satellite–Mn 2p1/2 peak separations, Mn 3s multiplet splittings, or Mn Auger parameters. To date, however, all of these values have not been available in a single reference. In this study, XPS has been used to obtain core level, Auger, and valence band spectra for a commercial, high purity MnO2 powder. This submission provides a reference that contains all of the Mn XPS data necessary for the identification of MnO2 and also provides information that may be useful for the analysis of other Mn compounds.