1998
DOI: 10.1134/1.1262063
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Influence of short-term annealing on the conductivity of porous silicon and the transition resistivity of an aluminum-porous silicon contact

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Cited by 22 publications
(13 citation statements)
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“…Fig. 6 clearly shows that Al contact to unmodified PS is Schottky by nature that is also supported by the literature [8][9][10]14] and the contact is ohmic after Pd surface modification. The J-V measurements were also conducted with Au contact under the identical condition to verify that Au gives rectifying contact, as expected, even after Pd modification.…”
Section: Electrical Characterizationsupporting
confidence: 72%
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“…Fig. 6 clearly shows that Al contact to unmodified PS is Schottky by nature that is also supported by the literature [8][9][10]14] and the contact is ohmic after Pd surface modification. The J-V measurements were also conducted with Au contact under the identical condition to verify that Au gives rectifying contact, as expected, even after Pd modification.…”
Section: Electrical Characterizationsupporting
confidence: 72%
“…From EDAX and XPS results it is verified that the presence of oxygen is higher in modified PS. Al contact to modified porous silicon appears to be low resistive ohmic contrary to the nonlinear nature reported with Al contact on unmodified porous silicon surface [8,14]. The specific contact resistance of Al contact to the modified PS layer was studied using the TLM method.…”
Section: Introductionmentioning
confidence: 95%
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“…So the Al contact to PS becomes rectifying Schottky junction in nature [18][19][20][21] and the stability of the material is disturbed (Figs. 7a and 8a).…”
Section: Discussionmentioning
confidence: 98%
“…However, the ohmic and rectifying nature depend on some properties of PSi like type of conductivity, porosity, and resistivity. For example, it was found that while PSi with low porosity and low resistivity forms ohmic contact with Al, both n-and p-type PSi with high resistivity forms Al-PSi contact of rectifying behavior (Simons et al 1995;Zimin et al 1995Zimin et al , 1998Kanungo et al 2009a). There are reports on the ohmic behavior of Al to PSi after the surface modification, presumably due to the reduction of the porosity through surface passivation (Kanungo et al 2009a;Maji et al 2010).…”
Section: Ohmic and Rectifying Behavior Of M-psi Contactsmentioning
confidence: 98%