2015
DOI: 10.1016/j.apsusc.2015.03.129
|View full text |Cite
|
Sign up to set email alerts
|

Influence of precursor concentration on the structural, optical and electrical properties of indium oxide thin film prepared by a sol–gel method

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
11
0

Year Published

2016
2016
2023
2023

Publication Types

Select...
9

Relationship

2
7

Authors

Journals

citations
Cited by 31 publications
(11 citation statements)
references
References 26 publications
0
11
0
Order By: Relevance
“…Indium oxide (In 2 O 3 ) is a promising n-type semiconductor material that has not only a wide band gap (∼3.75 eV), but also a high mobility (∼20 cm 2 V –1 s –1 ) and a good thermal stability. , In addition, its highly transparent property is also conducive to its optoelectronic applications . These satisfying optical, thermal, and electrical properties imply that In 2 O 3 should be a good potential ESL candidate in PSCs.…”
Section: Introductionmentioning
confidence: 99%
“…Indium oxide (In 2 O 3 ) is a promising n-type semiconductor material that has not only a wide band gap (∼3.75 eV), but also a high mobility (∼20 cm 2 V –1 s –1 ) and a good thermal stability. , In addition, its highly transparent property is also conducive to its optoelectronic applications . These satisfying optical, thermal, and electrical properties imply that In 2 O 3 should be a good potential ESL candidate in PSCs.…”
Section: Introductionmentioning
confidence: 99%
“…Electrical properties of the In 1.92 Fe 0.08 O 3 thin films were analysed by a Hall Effect Measurement System and the connections were done by the Van der Pauw method. The measurements were carried out in room temperature (29°C) and a dark atmosphere to prevent the photoconductive effect as it will affect the accuracy of measurements (Flores-Mendoza et al 2008;Lau et al 2015). Figure 9 shows that the resistivity of In 1.92 Fe 0.08 O 3 thin films decreases and the carrier concentration increases with increasing hydrogen flow rates.…”
Section: Resultsmentioning
confidence: 99%
“…[ 16 ] To improve the quality of the SnO 2 /perovskite interface, researchers have explored many interfacial materials, such as inorganic salts (KCl, [ 17 ] KOH, [ 18 ] NH 4 Cl, [ 19,20 ] and NH 4 F [ 21 ] ), organic small molecules (ethylenediaminetetraacetic acid [EDTA], [ 22 ] triphenylphosphine oxide [TPPO] [ 23 ] ), and polymers (polyethylene glycol [PEG], [ 24 ] poly(ethylene glycol) diacrylate ([PEGDA] [ 25 ] ). Particularly, previous literature report that In 2 O 3 can be utilized as ETL, [ 26–30 ] interlayer between transparent conducting oxide and ETL [ 26,31,32 ] or interlayer between ETL and perovskite layer [ 33–35 ] due to the high electron mobility (~25 cm 2 V −1 s −1 ), [ 36 ] high light transmission properties, [ 37 ] and low‐temperature processing (~200°C). [ 31 ] These interfacial materials facilitate the electron transfer at the SnO 2 /perovskite interface by aligning the conduction band maximum and passivating the interfacial defects.…”
Section: Introductionmentioning
confidence: 99%