2021
DOI: 10.1088/1742-6596/1837/1/012008
|View full text |Cite
|
Sign up to set email alerts
|

Influence of eccentric nanoindentation on top surface of silicon micropillar arrays

Abstract: In this paper we present an investigation of the influence of nanoindentation location on the top surface of silicon micro-pillar. This silicon micro-pillar array which will be employed as a micro force sensor array based on three-dimension silicon (3D Si) structures, is fabricated by near UV nanoimprint lithography (NIL) technique and etched by Cryogenic Inductively Coupled Plasma (ICP) sequentially. To determine its mechanical properties, those micropillars are measured by instrument indentation testing (IIT… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 4 publications
0
1
0
Order By: Relevance
“…Besides Raman spectroscopy, which is considered as an indirect mechanical testing method, nanoindentation had been employed in our previous investigation to directly characterize the mechanical properties of Si nanowires 29 , 68 , 69 . Here, Young’s modulus and hardness of vertical Si nanowires with different crystal orientations (i.e., Si <100> , Si <110> , and Si <111>) were determined.…”
Section: Resultsmentioning
confidence: 99%
“…Besides Raman spectroscopy, which is considered as an indirect mechanical testing method, nanoindentation had been employed in our previous investigation to directly characterize the mechanical properties of Si nanowires 29 , 68 , 69 . Here, Young’s modulus and hardness of vertical Si nanowires with different crystal orientations (i.e., Si <100> , Si <110> , and Si <111>) were determined.…”
Section: Resultsmentioning
confidence: 99%