Imaging the mechanical properties of nanowire arrays
Tianran Ma,
Michael Fahrbach,
Jiushuai Xu
et al.
Abstract:Dimensional and contact resonance (CR) images of nanowire (NW) arrays (NWAs) are measured using our newly developed microprobe CR imaging (CRI) setup. Then a reference method is employed to calculate the indentation modulus of NWs (M
i,NW
) representing the elasticity of NWs, by measuring NWAs and reference samples at the same static probing force. Furthermore, topography is imaged in combination with CR and M
i,N… Show more
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