Influence of beam conditions and energy for SEE testing

Self Cite

High sensitivity of SiC power MOSFETs has been observed under heavy ion irradiation, leading to permanent increase of drain and gate leakage currents. Electrical postirradiation analysis confirmed the degradation of the gate oxide and the blocking capability of the devices. At low drain bias, the leakage path forms between drain and gate, while at higher bias the heavy ion induced leakage path is mostly from drain to source. An electrical model is proposed to explain the current transport mechanism for heavy-ion degraded SiC power MOSFETs.

Section: B Heavy Ion Irradiation Testssupporting

confidence: 73%

Current Transport Mechanism for Heavy-Ion Degraded SiC MOSFETs

Martinella

Stark

Ziemann

et al. 2019

Self Cite

“…3, the LET distribution of the secondaries is very similar to that produced by 200-MeV protons in silicon, the main difference between the two arising near the LET of the projectile and lower values, which therefore account for most of the nuclear reaction cross section difference. Therefore, a component with an LET threshold above that of the primary beam is expected to have a similar SEE cross section to that associated with HE protons, in agreement to what was observed experimentally and through simulation in [8] and [31]. Thus, it can be concluded that reactions in the VHE and UHE regimes have cross sections that only weakly depend on the ion mass and are therefore comparable to those associated with protons and neutrons.…”

Section: B Nuclear Reaction Impact On Indirect Energy-deposition Seessupporting

confidence: 82%

“…Moreover, even if the SV is reached, in order for the SEE results as a function of LET to be meaningful, the range needs to be sufficient to cover the full SV thickness with a roughly constant LET value. As has been shown in the past, ions with similar LETs but different ranges can lead to very different SEE responses [8] due to insufficient beam penetration. Therefore, testing at larger ion energies can be beneficial both in terms of not requiring part opening and testing in a vacuum, as well as for guaranteeing a constant LET throughout the entire sensitive thickness.…”

Section: Introductionmentioning

confidence: 82%

Ultraenergetic Heavy-Ion Beams in the CERN Accelerator Complex for Radiation Effects Testing

Alía

Martinéz

Kastriotou

et al. 2019

Traditional heavy-ion testing for single-event effects is carried out in cyclotron facilities with energies around 10 MeV/n. Despite their capability of providing a broad range of linear energy transfer (LET) values, the main limitations are related to the need of testing in a vacuum and with the sensitive region of the components accessible to the low range ions. In this paper, we explore the use of ultrahigh energy (UHE) (5-150 GeV/n) ions in the CERN accelerator complex for radiation effects on electronics testing. At these energies, we show, both through simulations and experimental data, the significant impact of the ion energy on the ionization track structure and associated volume-restricted LET value, highlighting the possible limitations for radiation hardness assurance for highenergy accelerator applications. In addition, we show that from a nuclear interaction perspective, UHE ions behave similar to protons independently of their significantly larger mass.

“…As is observed for 12 C on silicon and copper, the Z values of the fusion products largely depend on the projectile and target mass, and can reach values of the sum of their individual Z. Similar simulated results were shown in [30] for a 124 Xe 46 MeV/n beam on silicon. Fig.…”

Section: A Calculations At a Production Levelsupporting

confidence: 80%

Proton Dominance of Sub-LET Threshold GCR SEE Rate

Alía

Brügger

Ferlet-Cavrois

et al. 2017

We apply a Monte Carlo based integral rectangular parallelpiped (IRRP) approach to evaluate the impact of heavy ion reaction products on the Galactic Cosmic Ray (GCR) Single Event Effect (SEE) rate, concluding that owing to their similar high-energy (> 100 MeV/n) SEE cross section and much larger abundance, protons are expected to be the dominating contributor. In addition, a broad set of components, ions and energies is used to explore the subLET threshold experimental region for standard ground-level heavy ion test energies, identifying an overall decreasing trend in the 10-80 MeV/n range due to the decreased contribution of complete and break-up fusion, and pointing out the limitations associated to the application of Monte Carlo SEE models in this energy interval.