2014
DOI: 10.1063/1.4904856
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Influence of alloy disorder scattering on the hole mobility of SiGe nanowires

Abstract: In this work, we analyze the influence of the alloy disorder (AD) scattering on the low-field hole mobility of Si1-xGex nanowires (NWs). To do it, the electrostatic description is achieved through a self-consistent solution of the Poisson equation and the six-band k⋅p method in the cross section of the NW. The momentum relaxation time approximation is used to calculate the hole mobility, including alloy disorder and phonon scattering mechanisms, and the use of approximations to calculate the overlap integrals … Show more

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Cited by 3 publications
(2 citation statements)
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“…Particularly, we have studied NWs with 5nm diameter oriented along the [111] direction (Fig. 1), since this orientation exhibits the best transport properties for holes in Si and Ge [9][10][11] . To allow a fair comparison of the electrostatics, the same high-κ insulator, Al 2 O 3 , with thickness T ins = 1.5nm and relative dielectric constant ε r = 9, is considered in all cases.…”
Section: Numerical Simulatormentioning
confidence: 99%
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“…Particularly, we have studied NWs with 5nm diameter oriented along the [111] direction (Fig. 1), since this orientation exhibits the best transport properties for holes in Si and Ge [9][10][11] . To allow a fair comparison of the electrostatics, the same high-κ insulator, Al 2 O 3 , with thickness T ins = 1.5nm and relative dielectric constant ε r = 9, is considered in all cases.…”
Section: Numerical Simulatormentioning
confidence: 99%
“…In this study, we are interested in the electrostatic behaviour of cylindrical gate-all-around (GAA) p-type NWs made of four different materials: two III-V antimonides, GaSb and InSb, and two group IV semiconductors, Si and Ge. Particularly, we have studied NWs with 5 nm diameter oriented along the (1 1 1) direction (figure 1), since this orientation exhibits the best transport properties for holes in Si and Ge [10][11][12]. To allow a fair comparison of the electrostatics, the same highκ insulator, Al 2 O 3 , with thickness T ins = 1.5 nm and relative dielectric constant ε r = 9, is considered unless otherwise specified.…”
Section: Numerical Simulatormentioning
confidence: 99%