2011 37th IEEE Photovoltaic Specialists Conference 2011
DOI: 10.1109/pvsc.2011.6186688
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Industrial high-rate (&#x223C;14 nm/s) deposition of low resistive and transparent ZnO<inf>x</inf>:Al films on glass

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Cited by 5 publications
(8 citation statements)
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“…Samples with 30:1 water to tin precursor ratio also demonstrated a reduction in growth rates with respect to translation speeds (see Table 1). The observed growth patterns are in-line with the reported APCVD of doped ZnO thin films where reduced film thicknesses are seen at low residence times [14]. In our studies, less pronounced difference is evident in the film growth rates at different dopant levels or precursor ratios as given in Table 1.…”
Section: Resultssupporting
confidence: 91%
See 1 more Smart Citation
“…Samples with 30:1 water to tin precursor ratio also demonstrated a reduction in growth rates with respect to translation speeds (see Table 1). The observed growth patterns are in-line with the reported APCVD of doped ZnO thin films where reduced film thicknesses are seen at low residence times [14]. In our studies, less pronounced difference is evident in the film growth rates at different dopant levels or precursor ratios as given in Table 1.…”
Section: Resultssupporting
confidence: 91%
“…The surface morphology is linked to other important characteristics of films, in particular the level of crystallographic orientation and the sheet resistance. Films with various electrical and optical properties have been reported for aluminium doped zinc oxide (ZnO) thin films by controlling the translation rate in the APCVD process [14]. According to the best of our knowledge, no studies have been conducted for the FTO thin film properties, probably due to lack of functionality within the process.…”
Section: Introductionmentioning
confidence: 99%
“…Typical sheet resistances used are 10 Ω/sq. Another reason of its popularity is not only the material quality, but also the availability of large scale deposition processes ( [4], [5]).…”
Section: Introductionmentioning
confidence: 99%
“…This way multilayers have been made and with approximately 450 nm layer thickness for each pass. Moreover, it was found that the full width half maximum of the (002) XRD peak declined more than with single layers, indicating a higher crystalline quality [11]. Indeed, crystal sizes increased and R ms values of 12 nm, 25 nm and 32 nm were obtained for single, double and triple passes, respectively.…”
Section: Zno Depositionmentioning
confidence: 95%