Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy

Xia, Fangzhou; Bozchalooi, Iman Soltani

doi:10.23919/acc.2017.7963591

Cited by 6 publications

(4 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A summary table of selected primary AFM modes of operation is provided in Table 2 . It is worth to notice that researchers have also developed other operation modes for specialized application such as the pulsed-force mode [ 17 ], induced-vibration contact detection mode [ 18 ], etc. For biomedical applications, the mechanical property and spectroscopy modes are more widely used and will be discussed in more details later in this review.…”

Section: Afm Basic Principlesmentioning

confidence: 99%

Review: Advanced Atomic Force Microscopy Modes for Biomedical Research

Xia

2022

Biosensors

View full text Add to dashboard Cite

Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such a powerful tool for biological and biomedical research. This review introduces novel AFM functionalities including high-speed imaging for dynamic process visualization, mechanobiology with force spectroscopy, molecular species characterization, and AFM nano-manipulation. These capabilities enable many new possibilities for novel scientific research and allow scientists to observe and explore processes at the nanoscale like never before. Selected application examples from recent studies are provided to demonstrate the effectiveness of these AFM techniques.

show abstract

Section: Afm Basic Principlesmentioning

confidence: 99%

Review: Advanced Atomic Force Microscopy Modes for Biomedical Research

Xia

2022

Biosensors

View full text Add to dashboard Cite

show abstract

“…To improve the demodulation speed, integration over integer number of periods is preferred over long time integration with low pass filter. Based on previous research, the oscillation amplitude can be extracted with only a few periods of the sinusoidal waveform [10]. With proper implementation of a pipeline for integration, the digital lock-in amplifier can produce amplitude value at the same throughput rate as that of the data acquisition.…”

Section: Afm Imaging System Designmentioning

confidence: 99%

“…A versatile imaging system is needed for various scenarios. Previous research efforts have focused on improving imaging speed of conventional AFM system by designing new generation scanners [8], utilizing smaller size cantilever probes with higher resonance frequencies [2], investigating new imaging modes [9,10], etc. As the imaging system throughput is proportional to the product of size, resolution and speed, simultaneously achieving high performances in all aspects is ideal but challenging [11].…”

Section: Introductionmentioning

confidence: 99%

Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

et al. 2019

View full text Add to dashboard Cite

Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due to multiple different refraction indices of materials. Spurious structure resonance can be excited from piezo actuator excitation. Photothermal actuation resolves the resonance confusion but makes optical setup more complicated. In this paper, we present the design and fabrication method of coated active scanning probes with piezoresistive deflection sensing, thermomechanical actuation and thin photoresist polymer surface coating. The newly developed probes are capable of conducting topography imaging in opaque liquids without the need of an optical system. The selected coating can withstand harsh chemical environments with high acidity (e.g., 35% sulfuric acid). The probes are operated in various opaque liquid environments with a custom designed AFM system to demonstrate the imaging performance. The development of coated active probes opens up possibilities for observing samples in their native environments.

show abstract

“…Proportional-integral-derivative (PID) controllers are widely accepted by users due to their simplicity. Several earlier works in the field have attempted to implement multiactuated scanner designs and the associated control strategies such as data-driven PID approach foo multiactuated scanner 21,22 and induced vibration contact detection jumping mode operation 23 for high-speed and large range performance. However, due to the controller and operation complexity, the previously proposed solutions have not successfully found their way to the microscopy industry and into the hands of scientists using these microscopes.…”

Section: Introductionmentioning

confidence: 99%

Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication

Rangelow

Ivanov

Ahmad

et al. 2017

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

View full text Add to dashboard Cite

With the recent advances in the field of nanotechnology, measurement and manipulation requirements at the nanoscale have become more stringent than ever before. In atomic force microscopy, high-speed performance alone is not sufficient without considerations of other aspects of the measurement task, such as the feature aspect ratio, required range, or acceptable probe-sample interaction forces. In this paper, the authors discuss these requirements and the research directions that provide the highest potential in meeting them. The authors elaborate on the efforts toward the downsizing of self-sensed and self-actuated probes as well as on upscaling by active cantilever arrays. The authors present the fabrication process of active probes along with the tip customizations carried out targeting specific application fields. As promising application in scope of nanofabrication, field emission scanning probe lithography is introduced. The authors further discuss their control and design approach. Here, microactuators, e.g., multilayer microcantilevers, and macroactuators, e.g., flexure scanners, are combined in order to simultaneously meet both the range and speed requirements of a new generation of scanning probe microscopes.

show abstract

Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy

Cited by 6 publications

References 16 publications

Review: Advanced Atomic Force Microscopy Modes for Biomedical Research

Review: Advanced Atomic Force Microscopy Modes for Biomedical Research

Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication

Contact Info

Product

Resources

About