2022
DOI: 10.3390/bios12121116
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Review: Advanced Atomic Force Microscopy Modes for Biomedical Research

Abstract: Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such … Show more

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Cited by 35 publications
(24 citation statements)
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“…These approaches use a variety of probes and modes of operation to detect, for example, physical, chemical, and biological interactions locally. 26 AFM relies on measuring forces between a small tip (typically a few nanometers in size) and the sample surface, and subsequently, its transformation into an image that reveals the three-dimensional topographic characteristics of the surface from which mechanical, electrical, and magnetic properties can be obtained. 27 Probes are usually made of silicon, silicon dioxide, or silicon nitride, which are produced using nanofabrication processes.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
See 3 more Smart Citations
“…These approaches use a variety of probes and modes of operation to detect, for example, physical, chemical, and biological interactions locally. 26 AFM relies on measuring forces between a small tip (typically a few nanometers in size) and the sample surface, and subsequently, its transformation into an image that reveals the three-dimensional topographic characteristics of the surface from which mechanical, electrical, and magnetic properties can be obtained. 27 Probes are usually made of silicon, silicon dioxide, or silicon nitride, which are produced using nanofabrication processes.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
“…Soft biological samples would be subject to high loading forces, so this approach is inappropriate for them. 26 Feedback changes the height z to maintain a constant deflection and loading force to image soft samples. This mode is known as continuous deflection mode or constant force mode.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
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“…This type of microscopy is based on determining the force between a small tip and the area of interest whose roughness parameters are to be established using a cantilever with a sharp tip at the end, and the force acting on the tip after interaction with the area of interest causes the cantilever to bend. By determining the deformation of the cantilever, it is possible to establish the force that occurs at the interaction between the peak and the evaluated area, and by writing down and processing these small deflections of the cantilever, surface topographies can be made by means of the atomic force microscope [2,54,55]. The aim of the research is to determine the zonal-local condition of surfaces through microtopography and the nano-roughness of dentures and assess how technology and the post-processing stage influence these aspects at a miniaturized scale.…”
Section: Surface Characteristics Measurement Of Dental Prosthesesmentioning
confidence: 99%