2000
DOI: 10.1016/s0924-4247(00)00444-1
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Indirect-coupling ultraviolet-sensitive photodetector with high electrical gain, fast response, and low noise

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Cited by 5 publications
(2 citation statements)
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“…They [41] were able to reduce the NEP to ∼4:4 fW by using a lock-in amplifier, which significantly increases S=N to ∼909. Qian et al [42] fabricated a Si UV-sensitive photodetector and tested its response in the range of 300-650 nm at different bias voltages. Their detector consisted of separate photoabsorption and charge multiplication regions, which were a shallow p-n junction for photoelectric conversion and a nearby n-p-n output transistor for signal amplification, respectively.…”
Section: Netd and Detectivitymentioning
confidence: 99%
“…They [41] were able to reduce the NEP to ∼4:4 fW by using a lock-in amplifier, which significantly increases S=N to ∼909. Qian et al [42] fabricated a Si UV-sensitive photodetector and tested its response in the range of 300-650 nm at different bias voltages. Their detector consisted of separate photoabsorption and charge multiplication regions, which were a shallow p-n junction for photoelectric conversion and a nearby n-p-n output transistor for signal amplification, respectively.…”
Section: Netd and Detectivitymentioning
confidence: 99%
“…In this paper our major interest is to derive a model and a monotone conservative scheme for its solution that would allow us to describe nonlinear transport phenomena in semiconductor structures with fast photoresponse. Such optically sensitive devices are gaining an increasing popularity in many engineering applications [7], while for a range of already existing devices, including hebt (hetero-structure-emitter bipolar transistors) and vfept (vertical field-effect photo-transistors), these transport phenomena are at the heart of functionality of the devices [1].…”
Section: Introductionmentioning
confidence: 99%