2011
DOI: 10.1088/1742-6596/281/1/012007
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Indentation-induced dislocations and cracks in (0001) freestanding and epitaxial GaN

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Cited by 20 publications
(15 citation statements)
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“…We note that images of deeper curvilinear dislocation loops appeared in the CL maps near the growth surface indents at high accelerating voltages, which were seen as dark lines with a contrast of 2.5-5% in all modes in accordance with previously published data [18].…”
Section: Resultssupporting
confidence: 91%
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“…We note that images of deeper curvilinear dislocation loops appeared in the CL maps near the growth surface indents at high accelerating voltages, which were seen as dark lines with a contrast of 2.5-5% in all modes in accordance with previously published data [18].…”
Section: Resultssupporting
confidence: 91%
“…In the case of monochromatic measurements, freshly introduced screw dislocations in the exciton CL band had dark contrast as reported previously [8,9,17]; in the panchromatic mode, the bright con trast of screw dislocations reached 20-30% at an accelerating voltage of V a = 5 kV. We note that images of deeper curvilinear dislocation loops appeared in the CL maps near the growth surface indents at high accelerating voltages, which were seen as dark lines with a contrast of 2.5-5% in all modes in accordance with previously published data [18].…”
Section: Resultssupporting
confidence: 69%
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“…2(a). The formation of similar dislocation lines along the o11-204 direction at the loading point of micro-indentation for freestanding GaN substrate has also been reported by Ratschinski et al [15].…”
Section: Resultssupporting
confidence: 79%