Abstract:Emerging nano-device based architectures are expected to experience high defect rates associated with the manufacturing process. In this paper, we introduce a novel built-in heterogeneous fault-tolerance scheme, which incorporates redundant circuitry into the design to provide fault tolerance. A thorough analysis of the new scheme was carried out for various system level metrics. The implementation and analysis were carried out on WISP-0, a stream processor implemented on the Nanoscale Application Specific Int… Show more
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