2017
DOI: 10.1016/j.nanoen.2017.02.008
|View full text |Cite
|
Sign up to set email alerts
|

In-situ TEM observation of Multilevel Storage Behavior in low power FeRAM device

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
18
0

Year Published

2018
2018
2021
2021

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 36 publications
(20 citation statements)
references
References 29 publications
0
18
0
Order By: Relevance
“…In recent years, with the continuous development of non-volatile random access memory (NVRAMNon-Volatile RAM) and its technology, various NVRAMs have emerged. Ferroelectric RAM (also known as FeRAM or FRAM) uses a layer of ferroelectric material to replace the original dielectric, making it also have the function of non-volatile memory [52]. Ferroelectric memory can be traced back to 1952.…”
Section: The Development Of Internal Memorymentioning
confidence: 99%
“…In recent years, with the continuous development of non-volatile random access memory (NVRAMNon-Volatile RAM) and its technology, various NVRAMs have emerged. Ferroelectric RAM (also known as FeRAM or FRAM) uses a layer of ferroelectric material to replace the original dielectric, making it also have the function of non-volatile memory [52]. Ferroelectric memory can be traced back to 1952.…”
Section: The Development Of Internal Memorymentioning
confidence: 99%
“…The big data era is a great challenge to current data storage technologies. [ 1,2 ] To improve memory capacity, the memristor is one of the most promising candidates for future nonvolatile memory (NVM) technologies. [ 3 ] Memristors show remarkable advantages in terms of area compaction (4F 2 , the F is the minimum technology feature size), fast write–read speeds, low energy consumption, and compatibility with the complementary metal‐oxide–semiconductor (CMOS) process.…”
Section: Introductionmentioning
confidence: 99%
“…Make allowances for a large number of researches about resistive switching and memory effects [29][30][31][32], the influence of adsorbed level on the resistive switching behavior, which seems that further research is needed. It is reasonable to expect that adsorbed level will have a noticeable impact on charge transport processes, and consequently will have significant influence on device property [33].…”
Section: Introductionmentioning
confidence: 99%