2018
DOI: 10.1134/s002044121804022x
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In Situ Surface Imaging Through a Transparent Diamond Tip

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Cited by 13 publications
(8 citation statements)
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“…As it was described in Ref. 7 an optical image that is directly seen through the indenterobjective consists of three sectors, so that the full-fledged image of the surface can be obtained by the linear translation these sectors. The scheme of an indented surface seen through the indenter is shown on the Fig.…”
Section: Experimental Procedures and Resultsmentioning
confidence: 99%
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“…As it was described in Ref. 7 an optical image that is directly seen through the indenterobjective consists of three sectors, so that the full-fledged image of the surface can be obtained by the linear translation these sectors. The scheme of an indented surface seen through the indenter is shown on the Fig.…”
Section: Experimental Procedures and Resultsmentioning
confidence: 99%
“…An indenter objective that was described elsewhere 7) can be used simultaneous indentation and Raman spectroscopy measurement. Such kind of approach allows in-situ investigation of phases both under the applied load or after it's removal.…”
Section: Resultsmentioning
confidence: 99%
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“…The refraction of the incident rays causes a distortion of observed in situ images, and the total reflection of that causes an invisible area. For the above reason, the visible area of the specimen surface around the contact area is quite limited in the in situ indentation technique by the use of optically transparent indenters proposed by Miyajima et al 8,9) and Feng et al 10,11) Maslenikov et al 12) proposed a new indenter shape for controlling incident ray paths, resulting in avoiding the distortion of observed in situ images attributed to the refraction of the rays. However, in their technique, the total reflection at the indenter/air interface can not be avoided except for using the indenter with a particular shape.…”
Section: Introductionmentioning
confidence: 99%
“…Предложенная в статье [9] конструкция индентора-объектива решает ключевую проблемуотсутствие возможности оптически наблюдать области под индентором -и позволяет создать новые приборы и методы для исследования сложнонапряженного состояния материала в области индентирования целым комплексом оптических методик.…”
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