2009
DOI: 10.1557/jmr.2009.0447
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In situ observations on deformation behavior and stretching-induced failure of fine pitch stretchable interconnect

Abstract: Electronic devices capable of performing in extreme mechanical conditions such as stretching, bending, or twisting will improve biomedical and wearable systems. The required capabilities cannot be achieved with conventional building geometries, because of structural rigidity and lack of mechanical stretchability. In this article, a zigzag-patterned structure representing a stretchable interconnect is presented as a promising type of building block. In situ experimental observations on the deformed interconnect… Show more

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Cited by 47 publications
(42 citation statements)
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“…As boundary conditions, in accordance with the experiments reported in [6], a uniaxial strain of 60% is prescribed along the -axis. The geometry of the sample is defined by the following values: 0 = 60 ∘ , l Cu = 2 mm, w Cu = 0.1 mm, W S = 10 mm, and L S = 8 mm.…”
Section: The Zigzag Patterned Interconnectmentioning
confidence: 92%
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“…As boundary conditions, in accordance with the experiments reported in [6], a uniaxial strain of 60% is prescribed along the -axis. The geometry of the sample is defined by the following values: 0 = 60 ∘ , l Cu = 2 mm, w Cu = 0.1 mm, W S = 10 mm, and L S = 8 mm.…”
Section: The Zigzag Patterned Interconnectmentioning
confidence: 92%
“…In this section, the deformation behaviour of two typical interconnect structures will be evaluated: the zigzag structure, as proposed in [6], and the horseshoe shape [4,7]. As argued previously, the horseshoe shape offers high stretchabilities (strains up to 100% have been achieved without metal failure) combined with a rather low I/O density.…”
Section: Application To Two Characteristic Three-dimensional Structuresmentioning
confidence: 99%
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