2015
DOI: 10.1002/adfm.201500545
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In‐Depth Studies on Rapid Photochemical Activation of Various Sol–Gel Metal Oxide Films for Flexible Transparent Electronics

Abstract: Despite intensive research on photochemical activation of sol–gel metal oxide materials, the relatively long processing time and lack of deep understanding of the underlying chemical courses have limited their broader impact on diverse materials and applications such as thin‐film electronics, photovoltaics, and catalysts. Here, in‐depth studies on the rapid photochemical activation of diverse sol–gel oxide films using various spectroscopic and electrical investigations for the underlying physicochemical mechan… Show more

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Cited by 183 publications
(218 citation statements)
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“…Due to their high T G % 360 C, PI substrates with thickness ranging from %3 to 50lm are widely used. 83,145,191,193,[197][198][199][220][221][222][223] Polyarylate (PAR) foils have also been employed, 192,200,224,225 given their good temperature stability (T G % 330 C), combined with a colorless transparency in the visible range. If the semiconductor deposition is performed at lower temperatures ( 150 C), also PES foils (T G around 200 C) can be utilized.…”
Section: Methodsmentioning
confidence: 99%
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“…Due to their high T G % 360 C, PI substrates with thickness ranging from %3 to 50lm are widely used. 83,145,191,193,[197][198][199][220][221][222][223] Polyarylate (PAR) foils have also been employed, 192,200,224,225 given their good temperature stability (T G % 330 C), combined with a colorless transparency in the visible range. If the semiconductor deposition is performed at lower temperatures ( 150 C), also PES foils (T G around 200 C) can be utilized.…”
Section: Methodsmentioning
confidence: 99%
“…The few available examples include Al 2 O 3 196,197 and PMMA layers. 220,221 In particular, 400 nm thick PMMA layers have been utilized to encapsulate flexible solution-processed In 2 O 3 and IGZO TFTs fabricated on thin spin coated PI. 220,221 In particular, PMMA encapsulations allow reducing the mechanical stress (and therefore crack formation) during the release of the PI foil from the rigid glass carrier.…”
Section: Methodsmentioning
confidence: 99%
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