Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs

Barragán, Manuel J.; Fiorelli, Rafaella; Léger, Gildas; Rueda, A.; Huertas, J.L.

doi:10.1109/ats.2011.15

Cited by 12 publications

(14 citation statements)

References 12 publications

(12 reference statements)

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“…Two main directions have been explored for the implementation of indirect testing, i.e. prediction-oriented strategy [2][3][4][5][6][7][8][9][10][11][12][13][14] or classification-oriented strategy [15][16][17][18][19][20] as illustrated in figure 2. In the first direction, the training set is used to derive functions that map the low-cost indirect measurements to the performance parameters (typically using statistical regression models or artificial neural networks).…”

Section: A Indirect/alternate Test Principlementioning

confidence: 99%

“…As a consequence thanks to indirect testing, it is possible to significantly decrease the number and complexity of measurement configurations. Despite the clear advantages of employing such approach and a number of convincing attempts to prove its efficiency [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21], the deployment of the indirect test strategy in industry is limited. A solution to enhance the confidence in the test method is to implement a strengthened strategy based on prediction model redundancy [21].…”

Section: Introductionmentioning

confidence: 99%

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Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements

Ayari¹,

Azaïs²,

Bernard³

et al. 2014

Microelectronics Journal

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The greedy specification testing remains mandatory for analog and Radio Frequency (RF) integrated circuits because of the accuracy of the sorting based on these measurements. Unfortunately, to be implemented, this kind of testing method often incurs very high costs (expensive instruments, long test time...). A common approach, in the literature, is the so-called indirect/alternate test strategy. This strategy consists in deriving targeted specifications from low-cost Indirect Measurements (IMs). During the industrial test phase, the estimation of regular specifications using IMs is based on a correlation model that has been built previously, during a training phase. Despite the substantial test cost reduction offered by this strategy, its deployment in industry is limited, mainly because of a lack of confidence in the accuracy of estimations made by the correlation model. A solution to increase the confidence in the estimation of specifications using the indirect approach is to implement redundancy in the prediction phase. In this paper, we demonstrate that the redundancy implementation brings more than identifying rare misjudged circuits from a high-correlated model. Indeed redundancy massively increases the accuracy despite of the lack of accurate models that have been assumed in previous implementations of redundant indirect testing. This approach is illustrated on a real case study for which we have experimental measurements on a set of 10,000 devices.

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Section: A Indirect/alternate Test Principlementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements

Ayari¹,

Azaïs²,

Bernard³

et al. 2014

Microelectronics Journal

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show abstract

“…S i � � S i + a; tl.X (2) where S i � corresponds to signature S i measured under op erating condition X + tl.X, and X is the nominal operating condition. Equation (2) can be expanded as, …”

Section: Asmentioning

confidence: 99%

“…Thus, finding an appropriate set of signatures to extract meaningful models is usually a matter of creativity based on a precise knowledge of the DUT. In this line, the work in [2] explores the use of a simple multi-VDD technique to improve the accuracy of RF alternate test at almost no extra engineering cost. This paper extends this multi-VDD technique to a generalized multi-condition strategy.…”

Section: Introductionmentioning

confidence: 99%

Multi-condition alternate test of analog, mixed-signal, and RF systems

Barragán

Léger

Huertas

2012

2012 13th Latin American Test Workshop (LATW)

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This work proposes a generic path to improve Alternate Test strategies. It demonstrates that multi-condition test increases the amount of information present in the test data and consequently decreases the prediction error of the trained models. The ambition of this paper is to be a methodological contribution to the field of AMS-RF test, and formal guidelines are provided that justify the interest of the approach. For the sake of validation, the proposed methodology has been applied to several alternate test strategies for analog, mixed signal, and RF circuits. Promising results are found for the following case studies: an analog filter, a I:ll. AID converter, and an RF LNA.

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“…Alternate testing has been widely studied in the literature for many years [1][2][3][4][5][6][7][8][9][10]. Many aspects have been researched, such as the choice of the learning algorithm, the definition and optimization of appropriate test stimuli, the processing of complex signatures, the use of embedded sensors to gather pertinent information, the exploitation multi-Vdd test conditions and procedures for the selection of appropriate indirect measurements.…”

Section: Introductionmentioning

confidence: 99%

New implementions of predictive alternate analog/RF test with augmented model redundancy

Ayari

Azais

Bernard

et al. 2014

Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE), 2014

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This paper discusses new implementations of the predictive alternate test strategy that exploit model redundancy in order to improve test confidence. The key idea is to build during the training phase, not only one regression model for each specification as in the classical implementation, but several regression models. This redundancy is then used during the testing phase to identify suspect predictions and remove the corresponding devices from the alternate test flow. In this paper, we explore various options for implementing model redundancy, based on the use of different indirect measurement combinations and/or different partitions of the training set. The proposed implementations are evaluated on a real case study for which we have production test data from 10,000 devices.

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Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs

Cited by 12 publications

References 12 publications

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements

Multi-condition alternate test of analog, mixed-signal, and RF systems

New implementions of predictive alternate analog/RF test with augmented model redundancy

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