Abstract:The greedy specification testing remains mandatory for analog and Radio Frequency (RF) integrated circuits because of the accuracy of the sorting based on these measurements. Unfortunately, to be implemented, this kind of testing method often incurs very high costs (expensive instruments, long test time...). A common approach, in the literature, is the so-called indirect/alternate test strategy. This strategy consists in deriving targeted specifications from low-cost Indirect Measurements (IMs). During the ind… Show more
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