2022
DOI: 10.1109/jphotov.2021.3120506
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Improving CdSeTe Devices With a Back Buffer Layer of CuxAlOy

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Cited by 9 publications
(10 citation statements)
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“…Most striking is the low J SC at ∼26.5 mA cm –2 . We note that similar devices prepared on a FTO substrate with higher transparency (Tec 12D) exhibited J SC values of 27.9 mA cm –2 . Turning to the EQE data shown in Figure to determine where J SC is lost, we see that the long wavelength edge goes to ∼900 nm, indicating that the near-front-surface bandgap value of 1.38 eV has been achieved, as expected for optimal CdSe x Te 1– x alloying.…”
mentioning
confidence: 54%
“…Most striking is the low J SC at ∼26.5 mA cm –2 . We note that similar devices prepared on a FTO substrate with higher transparency (Tec 12D) exhibited J SC values of 27.9 mA cm –2 . Turning to the EQE data shown in Figure to determine where J SC is lost, we see that the long wavelength edge goes to ∼900 nm, indicating that the near-front-surface bandgap value of 1.38 eV has been achieved, as expected for optimal CdSe x Te 1– x alloying.…”
mentioning
confidence: 54%
“…To understand the changes occurring near the front interface in more detail, PL spectra were measured through the glass side of the devices before and after LS (Figure a,b). PL spectra for CdSe/CdTe devices have been rarely reported in the literature, and data as a function of the initial CdSe layer thickness have not appeared to date. Before LS, the PL emission was relatively broad and comprised of multiple underlying emission peaks that are difficult to resolve at room temperature.…”
Section: Results and Discussionmentioning
confidence: 99%
“…PL spectra for CdSe/CdTe devices have been rarely reported in the literature, 9 and data as a function of the initial CdSe layer thickness have not appeared to date. Before LS, the PL emission was relatively broad and comprised of multiple underlying emission peaks that are difficult to resolve at room temperature.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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