2008
DOI: 10.1049/el:20081998
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Improvements of AlN/GaN MISFET DC and RF characteristics with in situ deposited Si3N4

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Cited by 11 publications
(2 citation statements)
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“…To our knowledge these are the best RF performance of GaNbased HEMTs on LR Si to date. In addition, our device RF performance is higher than that reported in [10], [11] where sapphire and HR Si were used, respectively.…”
Section: B Rf Characteristicsmentioning
confidence: 55%
“…To our knowledge these are the best RF performance of GaNbased HEMTs on LR Si to date. In addition, our device RF performance is higher than that reported in [10], [11] where sapphire and HR Si were used, respectively.…”
Section: B Rf Characteristicsmentioning
confidence: 55%
“…Thus, in order to solve these issues, the insertion of a gate insulator and passivation layer in the access region such as Al 2 O 3 , HfO 2 , Ta 2 O 5 , SiN x is widely adopted. [12][13][14][15][16][17][18][19][20] To avoid Ga-O bond formation which may cause current collapse, 21) nitride-based dielectrics especially AlN are more favored due to the larger bandgap of AlN and smaller lattice mismatch. [22][23][24][25][26][27][28][29][30][31] Recently, plasma-enhanced atomic layer deposition (PEALD) AlN as passivation layer has been proposed.…”
Section: Introductionmentioning
confidence: 99%