The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991
DOI: 10.1109/pvsc.1991.169246
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Improvements in silicon solar cell performance

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Cited by 15 publications
(10 citation statements)
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“…efficiency of 21.5 % on a thinned-down monocrystalline Si wafer with a thickness of 47µm [2]. Unfortunately this is not a real Si thin-film technology but still a Si wafer technology.…”
mentioning
confidence: 99%
“…efficiency of 21.5 % on a thinned-down monocrystalline Si wafer with a thickness of 47µm [2]. Unfortunately this is not a real Si thin-film technology but still a Si wafer technology.…”
mentioning
confidence: 99%
“…6. Fitting measured PERL cell dark I-V characteristics [15] with S eff calculated according to SRH and amphoteric recombination models with the same surface parameters leading to the S eff matching displayed in Fig. 5.…”
Section: Impact Of the Hump On Solar Cell Performance Under Illummentioning
confidence: 96%
“…Textured surfaces have an advantage of a light-trapping due to their reduced reection and increased optical path length in reection or absorption. The solar cells can be textured using a photolithographic technique [9], chemical and electrochemical etching [10,11] and reactive ion etching (RIE) [12,13].…”
Section: Reduction Of the Optical Losses Inmentioning
confidence: 99%