Abstract:Defect localization has become more complicated in the FinFET era. As with planar devices, it is still generally possible to electrically isolate a failure down to a single transistor. However, the complexity of certain FinFET devices can lead to ambiguity as to the exact physical location of the defect. The default technique for isolating the defect location for this type of device is to start with a plan view S/TEM lamellae. Once the defect is located in plan view, the lamellae can be converted to cross-sect… Show more
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