Improved integrated circuits qualification using Dynamic Laser Stimulation techniques

Deyine, Amjad; Sanchez, Kévin; Perdu, Philippe; Battistella, F.; Lewis, Dean

doi:10.1109/irps.2009.5173260

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Cited by 3 publications

(2 citation statements)

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“…Some experiments were carried out to validate this approach [18,19]. The first Studied component was a Quad Input Nand gate.…”

Section: Vdd Vddmentioning

confidence: 99%

Fault localization by Dynamic Laser Stimulation extended testing

Perdu

2009

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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“…Some experiments were carried out to validate this approach [18,19]. The first Studied component was a Quad Input Nand gate.…”

Section: Vdd Vddmentioning

confidence: 99%

Fault localization by Dynamic Laser Stimulation extended testing

Perdu

2009

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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“…Therefore localization techniques are more and more accurate despite the fact they could be complex to set up. Moreover these sensitive techniques could be very effective in other fields than failure analysis since they give accurate information about device internal robustness evolution [5].…”

Section: Introductionmentioning

confidence: 99%