“…Alternatively, it was reported that a direct reconstruction of the phase and the amplitude of the scattered electron wave from a focal series of HRTEM images is suitable to extend the interpretable resolution of a field emission microscope down to its information limit 10 . Several approaches were published to tackle the problem of resolution extension 11,12,13,14,15,16 with an earliest contribution suggested by Schiske 17 . Subsequently, phaseretrieval electron microscopy was developed into a generally applicable tool that extended the resolution of 200 kV and 300 kV field emission electron microscopes to values around 0.14 nm 18,19,20,21 and provides the possibility to correct lens aberrations by software 22 .…”