2009
DOI: 10.1016/j.nimb.2009.05.055
|View full text |Cite
|
Sign up to set email alerts
|

Implantation of anatase thin film with 100 keV 56Fe ions: Damage formation and magnetic behaviour

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
9
0

Year Published

2010
2010
2014
2014

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 6 publications
(10 citation statements)
references
References 34 publications
1
9
0
Order By: Relevance
“…AFM analysis of the irradiated surfaces shows a gradual decrease in RMS roughness from a value of 3.2 nm at an ion fluence of 10 16 ions/cm 2 to less than 1 nm for the highest fluence. The same surface morphology has been observed after implantation with 100 keV Fe + ions to an ion fluence of 3 Â 10 16 ions/cm 2 [4].…”
Section: Resultssupporting
confidence: 74%
See 4 more Smart Citations
“…AFM analysis of the irradiated surfaces shows a gradual decrease in RMS roughness from a value of 3.2 nm at an ion fluence of 10 16 ions/cm 2 to less than 1 nm for the highest fluence. The same surface morphology has been observed after implantation with 100 keV Fe + ions to an ion fluence of 3 Â 10 16 ions/cm 2 [4].…”
Section: Resultssupporting
confidence: 74%
“…3, shows very clearly that the surface has a grainy morphology with 'crystallites' of %50-150 nm in size [4]. There are gaps between the individual grains, giving the top surface a very rough or protruding appearance.…”
Section: Resultsmentioning
confidence: 95%
See 3 more Smart Citations