Impedance criterion for power modules comparison

Schanen, Jean‐Luc; Martin, Christian; Frey, D.; Pasterczyk, Robert

doi:10.1109/tpel.2005.861112

Cited by 17 publications

(11 citation statements)

References 12 publications

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“…Therefore, it can be concluded that magnetic effects were responsible of the perturbation. Cabling rules used in [11] confirmed this remark. In such integrated structures, it is not easy to modify the internal gate circuit layout, as it was done in [11], especially due to double sided technology.…”

Section: Investigation Of Internal Disturbance In a Double Sided supporting

confidence: 62%

Electromagnetic Considerations for Designing Double-Sided Power Modules

Mandray

Guichon

Schanen

et al. 2007

2007 IEEE Industry Applications Annual Meeting

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Double-sided power modules are especially attractive due to high thermal performances. Thanks to the stacking of two DBCs, very low stray inductances may be expected, especially because of the proximity of the two rear metallization. On the other hand, capacitive effects may be increased. In this paper, the complete electromagnetic behaviour of double sided power modules is studied, regarding both internal coupling, and unwanted EMC emissions. Some layout and active solutions are proposed to reduce common mode emissions.

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Section: Investigation Of Internal Disturbance In a Double Sided supporting

confidence: 62%

Electromagnetic Considerations for Designing Double-Sided Power Modules

Mandray

Guichon

Schanen

et al. 2007

2007 IEEE Industry Applications Annual Meeting

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“…The 3D model includes the wire bonds. The complete workflow, from the 3D description to the generation of a circuit model compatible with the Saber R software is described in detail in [24]. As this circuit model contains 32 ports (16 impedances and the coupling between any two of these), it is too large to be shown here.…”

Section: A Phase-leg Inverter Modellingmentioning

confidence: 99%

Design and Implementation of Integrated Common Mode Capacitors for SiC-JFET Inverters

Robutel

Martin

Buttay

et al. 2014

IEEE Trans. Power Electron.

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Abstract-This paper deals with the issue of electromagnetic interference (EMI) in SiC-JFET inverter power modules, and proposes a solution to limit conducted emissions at high frequencies. SiC-JFET inverters can achieve very fast switching, thereby reducing commutation losses, at the cost of a high level of EMI. In order to limit conducted EMI emissions, it is proposed to integrate small-value common mode (CM) capacitors, directly into the power module. High frequency noise, which is usually difficult to filter, is then contained within the module, thus keeping it far from the external network. This approach is in line with the current trend towards the integration of various functions (such as protection, sensors or drivers) around power devices in modern power modules. To demonstrate this concept, the resulting CM noise was investigated, and compared with a standard configuration. Simulations were used to design the integrated capacitors, and measurements were carried out on an experimental SiC-JFET half-bridge structure. A significant reduction was achieved in the experimentally observed CM conducted emissions, with a very minor influence on the switching waveforms, losses and overall size of the system. The benefits and limitations of this design are discussed, for the case of mid-power range inverters for aircraft applications.

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“…However, when one aims to precisely evaluate disturbances, the usual models need to be more detailed. Electrical components in particular have to be described with all their stray elements including the ones due to the integration in the complex electromagnetic environment [3][4][5]. This increasing complexity of models unfortunately directly impacts on the time of simulation that can become unreasonably long.…”

Section: Introductionmentioning

confidence: 99%

Fast Reconstitution Method (FRM) to Compute the Broadband Spectrum of Common Mode Conducted Disturbances

Labrousse

Revol²,

Gautier³

et al. 2013

IEEE Trans. Electromagn. Compat.

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Abstract-This paper deals with time domain simulation of common mode (CM) conducted disturbances in power electronics. The study proposes a proof of concept of a Fast Reconstruction Method (FRM) which allows to compute the spectrum of a common mode current based on the knowledge of a single pulse of current (i.e. the knowledge of the disturbances on a small fraction of time) and of the switching instants (i.e. the control strategy of the structure). The first parts of the paper demonstrate the reliability of the method using data measurements of a common mode current generated by a PWM half bridge converter and then by a three phase inverter. The simulation time saved thanks to the FRM is then quantified by comparing the simulation durations with or without using the FRM. In our example, the FRM allows to divide the simulation time by about 10.This analysis points out that the complex information of a CM current is contained in a small time interval. As a consequence the complete spectrum can be predicted with only a very fast simulation. The mathematical techniques developed here forecast promising reduction of simulation durations.

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Impedance criterion for power modules comparison

Cited by 17 publications

References 12 publications

Electromagnetic Considerations for Designing Double-Sided Power Modules

Electromagnetic Considerations for Designing Double-Sided Power Modules

Design and Implementation of Integrated Common Mode Capacitors for SiC-JFET Inverters

Fast Reconstitution Method (FRM) to Compute the Broadband Spectrum of Common Mode Conducted Disturbances

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