Imaging at the Nanoscale With Practical Table-Top EUV Laser-Based Full-Field Microscopes

Brizuela, F.; Howlett, Isela D.; Carbajo, Sergio; Peterson, Diana; Sakdinawat, Anne; Liu, Yanwei; Attwood, David; Marconi, M. C.; Rocca, J. J.; Menoni, Carmen S.

doi:10.1109/jstqe.2011.2158393

Cited by 10 publications

(2 citation statements)

References 37 publications

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“…The timescale of exchange interaction in a ferromagnetic alloy was recently studied with HHG utilizing the M-edges of Fe and Ni in a T-MOKE experiment [78], [79]. Various imaging approaches have been developed utilizing HHG sources, including full-field transmission X-ray microscopes [80] and coherent diffractive imaging (CDI) down to 22 nm spatial resolution [81] in the extreme ultraviolet (EUV) regime. Recent achievements with HHG are tunable polarization [82] and the creation of high-harmonic beams with controlled angular momentum [83], which make magnetic X-ray microscopy at lab-based sources feasible in the near future.…”

Section: Polarized Soft X-rays As a Probe For Magnetism A Sourcmentioning

confidence: 99%

X-Ray Imaging of Magnetic Structures

Fischer

2015

IEEE Trans. Magn.

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The characterization of nanoscale magnetic structures, their static properties, and fast spin dynamics with polarized soft X-rays has become an indispensable analytical tool due to the unique features of those probes. The spectroscopic magnetic response serves as a fingerprint of the specimen and can give quantitative information on element-specific spin and orbital magnetic moments. Images of magnetic domain structures at a spatial resolution down to nearly 10 nm, ultimately in all three dimensions, can be obtained with various X-ray microscopy techniques and can further be combined with stroboscopic pump-probe schemes to image the spin dynamics of spin structures, such as the motion of domain walls in nanowires or the vortex core dynamics in micropatterned magnetic elements. Next generation sources of polarized soft X-rays such as X-ray free electron lasers or high-harmonic generation laser sources hold the promise to provide nanometer spatial and femtosecond time resolution, enabling to address thus fundamental magnetic length and time scales in magnetism. This paper reviews the various X-ray imaging techniques using polarized soft X-rays by summarizing their characteristic features, recent achievements, and current limitations as well as future opportunities. A brief overview on other magnetic imaging techniques are given to set magnetic X-ray imaging techniques into context. Index Terms-Magnetic diffractive imaging, photoemission electron microscopy, soft X-ray spectromicroscopy, spin dynamics, X-ray magnetic circular dichroism (XMCD), X-ray optics. 0018-9464

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Section: Polarized Soft X-rays As a Probe For Magnetism A Sourcmentioning

confidence: 99%

X-Ray Imaging of Magnetic Structures

Fischer

2015

IEEE Trans. Magn.

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“…X-ray microscopy is a nanoimaging technique with unique abilities to work under a variety of ambient conditions, imaging in real space with high temporal − and spatial resolutions − combined with chemical analysis capabilities and unique contrast mechanisms , even magnetic contrast . While the technique has long been considered to be confined to synchrotron radiation sources, recent developments have led to the introduction of new laboratory X-ray sources and microscopes, − improving its accessibility and rendering its technical components highly desirable to a broader community. ,, Basically, the Fresnel zone plate (FZP) is inevitably the core element behind high-resolution X-ray and extreme ultraviolet imaging. A FZP is a diffractive optic capable of focusing high energy electromagnetic radiation.…”

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confidence: 99%

Rapid Prototyping of Fresnel Zone Plates via Direct Ga⁺ Ion Beam Lithography for High-Resolution X-ray Imaging

et al. 2013

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A significant challenge to the wide utilization of X-ray microscopy lies in the difficulty in fabricating adequate high-resolution optics. To date, electron beam lithography has been the dominant technique for the fabrication of diffractive focusing optics called Fresnel zone plates (FZP), even though this preparation method is usually very complicated and is composed of many fabrication steps. In this work, we demonstrate an alternative method that allows the direct, simple, and fast fabrication of FZPs using focused Ga(+) beam lithography practically, in a single step. This method enabled us to prepare a high-resolution FZP in less than 13 min. The performance of the FZP was evaluated in a scanning transmission soft X-ray microscope where nanostructures as small as sub-29 nm in width were clearly resolved, with an ultimate cutoff resolution of 24.25 nm, demonstrating the highest first-order resolution for any FZP fabricated by the ion beam lithography technique. This rapid and simple fabrication scheme illustrates the capabilities and the potential of direct ion beam lithography (IBL) and is expected to increase the accessibility of high-resolution optics to a wider community of researchers working on soft X-ray and extreme ultraviolet microscopy using synchrotron radiation and advanced laboratory sources.

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Nanoscale Imaging with Soft X-Ray Lasers

Menoni

Nejdl

Monserud

et al. 2015

Springer Proceedings in Physics

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Imaging at the Nanoscale With Practical Table-Top EUV Laser-Based Full-Field Microscopes

Cited by 10 publications

References 37 publications

X-Ray Imaging of Magnetic Structures

X-Ray Imaging of Magnetic Structures

Rapid Prototyping of Fresnel Zone Plates via Direct Ga⁺ Ion Beam Lithography for High-Resolution X-ray Imaging

Nanoscale Imaging with Soft X-Ray Lasers

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Imaging at the Nanoscale With Practical Table-Top EUV Laser-Based Full-Field Microscopes

Cited by 10 publications

References 37 publications

X-Ray Imaging of Magnetic Structures

X-Ray Imaging of Magnetic Structures

Rapid Prototyping of Fresnel Zone Plates via Direct Ga+ Ion Beam Lithography for High-Resolution X-ray Imaging

Nanoscale Imaging with Soft X-Ray Lasers

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Product

Resources

About

Rapid Prototyping of Fresnel Zone Plates via Direct Ga⁺ Ion Beam Lithography for High-Resolution X-ray Imaging