1995
DOI: 10.1016/0022-3697(94)00257-6
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III–V Nitrides—thermodynamics and crystal growth at high N2 pressure

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Cited by 134 publications
(91 citation statements)
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“…As predicted by simulation the sample with the graded InGaN layer shows a significant increase of the sheet carrier concentration from 2.1x10 13 cm −2 for the reference sample to 2.9x10 13 cm −2 for the quasi 3DEG sample. Taking into account the thickness of about 10 nm of the graded InGaN layer the corresponding maximum indium content should be around 30 % according to the simulation results.…”
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confidence: 63%
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“…As predicted by simulation the sample with the graded InGaN layer shows a significant increase of the sheet carrier concentration from 2.1x10 13 cm −2 for the reference sample to 2.9x10 13 cm −2 for the quasi 3DEG sample. Taking into account the thickness of about 10 nm of the graded InGaN layer the corresponding maximum indium content should be around 30 % according to the simulation results.…”
supporting
confidence: 63%
“…We defined the channel width as the region below the Fermi level. The calculated sheet carrier concentration for the InGaN containing structure is N S = 2.8x10 13 cm −2 while the simulations predict N S = 1.7x10 13 cm −2 for the conventional 2DEG FET structure.…”
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confidence: 84%
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“…[9][10][11][12][13] Single crystals of GaN are generally grown under high temperature ͑1700-1800 K͒/ high pressure conditions ͑Ͼ2 GPa for ϳ20 h͒ since GaN decomposes at ϳ1150 K under ambient pressure. [14][15][16] Recent experiments indicate sodium fluxes can be useful for crystal growth. 17 Solid-state metathesis ͑SSM͒ reactions have developed over the past several years into an effective rapid method for producing materials such as nitrides that are difficult to make using conventional techniques.…”
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confidence: 99%