In situ transmission electron microscopy studies of the kinetics of Pt-Mo alloy diffusion in ZrB2 thin films

Abstract

Using in situ high-temperature (1073–1173 K) transmission electron microscopy, we investigated the thermal stability of Pt and Mo in contact with polycrystalline ZrB2 thin films deposited on Al2O3(0001). During annealing, we observed the diffusion of cubic-structured Pt1−xMox (with x = 0.2 ± 0.1) along the length of the ZrB2 layer. From the time-dependent increase in diffusion lengths, we determined that the Pt1−xMox does not react with ZrB2, but diffuses along the surface with a constant temperature-dependent velocity. We identify the rate-limiting step controlling the observed phenomenon as the flux of Mo atoms with an associated activation barrier of 3.8 ± 0.5 eV.

Ceramic Sensors: A mini-review of their applications

“…Earlier work on high temperature insulation layers have reported the use of an Al 2 O 3 thin film, which is deposited on metals, enhancing the capabilities of temperature insulation (Duan et al, 2017), but this thin film is removed when the temperature cycling test is finished, because of the thermal stress mismatch between the ceramic thin film and the metal (Sheng et al, 2013) giving rise to unrepeatable results not required for sensors. Another way of making an insulation layer is through TBC (Thermal Barrier Coating) technology that attaches a lower thermal conductive ceramic material to the surface of a turbine blade (Jouanny et al, 2013). In this context.…”

ZrB2 Thin Films : Growth and Characterization

“…ZrB2 thin films have been grown by CVD [6,7,11,[18][19][20][21][22][23][24], pulsed laser deposition [25,26], e-beam deposition [26][27][28], sputtering of reactive multilayers [29], and sputtering from a compound source [30][31][32][33][34][35][36][37][38][39][40][41][42][43].…”