2017
DOI: 10.1103/physrevapplied.7.054004
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In situ Polarized Neutron Reflectometry: Epitaxial Thin-Film Growth of Fe on Cu(001) by dc Magnetron Sputtering

Abstract: The step-wise growth of epitaxial Fe on Cu(001)/Si(001), investigated by in-situ polarized neutron reflectometry is presented. A sputter deposition system was integrated into the neutron reflectometer AMOR at the Swiss neutron spallation source SINQ, which enables the analysis of the microstructure and magnetic moments during all deposition steps of the Fe layer. We report on the progressive evolution of the accessible parameters describing the microstructure and the magnetic properties of the Fe film, which r… Show more

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Cited by 14 publications
(17 citation statements)
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“…Originally designed for the REFSANS experiment at the MLZ in Garching, the compact and flexible design allows the use of the system in virtually any beamline with suitable geometry. Originally commissioned, tested and optimized at REFSANS, the first published experimental data using the deposition system was in fact obtained at the AMOR beamline at Paul Scherrer Institute, Villigen, Switzerland [12]. 45 Figure 15: Photograph of the complete deposition system with all auxiliary components.…”
Section: Discussionmentioning
confidence: 99%
“…Originally designed for the REFSANS experiment at the MLZ in Garching, the compact and flexible design allows the use of the system in virtually any beamline with suitable geometry. Originally commissioned, tested and optimized at REFSANS, the first published experimental data using the deposition system was in fact obtained at the AMOR beamline at Paul Scherrer Institute, Villigen, Switzerland [12]. 45 Figure 15: Photograph of the complete deposition system with all auxiliary components.…”
Section: Discussionmentioning
confidence: 99%
“…ex situ), and thus emergent behavior during thin-film growth could not be investigated by this technique. Facilitated by recent developments [34,35], PNR can now also be applied as an in situ technique (iPNR). By growing samples at the neutron beamline, iPNR allows the evolution of the structural and magnetic properties of the entire film to be captured as a function of the layer thicknesses, one deposition step after the other.…”
Section: Methodsmentioning
confidence: 99%
“…Since the 1980s an important technique to characterize such samples came into play: polarized neutron reflectometry (PNR). It was recently used to study the growth of Fe on Cu(001)/Si(001) (Figure c) from the sub‐ML regime where island growth dominates below 4 MLs (Figure 4d), and layer‐by‐layer growth occurs for subsequent layers up until the total thickness is approximately 30 MLs …”
Section: The First Atomically Thin Magnets In Elemental Co Fe and Nimentioning
confidence: 99%