2010
DOI: 10.1016/j.cap.2009.11.059
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Hydrogenated amorphous silicon film as intrinsic passivation layer deposited at various temperatures using RF remote-PECVD technique

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Cited by 26 publications
(20 citation statements)
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“…The high V OC was attributed to the excellent surface passivation of the thin intrinsic amorphous silicon layer. However, the heterojunction solar cell requires a low‐temperature process below 250°C and therefore necessitates dedicated low‐temperature processes such as transparent conductive oxide deposition and metallization using a low‐temperature firing paste . Management of the overall process temperature is necessary to obtain outstanding HIT solar cells performance.…”
Section: Introductionmentioning
confidence: 99%
“…The high V OC was attributed to the excellent surface passivation of the thin intrinsic amorphous silicon layer. However, the heterojunction solar cell requires a low‐temperature process below 250°C and therefore necessitates dedicated low‐temperature processes such as transparent conductive oxide deposition and metallization using a low‐temperature firing paste . Management of the overall process temperature is necessary to obtain outstanding HIT solar cells performance.…”
Section: Introductionmentioning
confidence: 99%
“…Interestingly, this released photon is detected by OES only in the plasma for the low-H cell, while this peak vanishes for the high-H cell. Thus, the plasma in low-H i-layer deposition contains a much larger amount of SiH 2 , finally leading to void-rich and low-quality i-layer [26,27]. In addition, another effect accompanied with high SiH 2 amount is the increased generation rate of poly silane (gas particle formation), Si 2 H 6 , according to [28] SiH 2 + SiH 4 → Si 2 H 6 (7)…”
Section: Resultsmentioning
confidence: 99%
“…At the same time, the intensity of the doublet reduces, indicating a better network structure at elevated temperature. On the other hand, reduces in a linear manner, indicating a better a-SiO :H(i) network with less H clusters and microvoids [42,61]. The combination of a high H due to slow H depletion and an improved amorphous network results in an excellent passivation quality within the process window observed in Figure 7.…”
Section: Bonding Configurationmentioning
confidence: 96%
“…The initial increase of lifetime is due to better bonding structure benefited from thermal relaxation [42,61]. Higher temperature releases incorporated H atoms from trapped state (Si-H 2 ), which is reflected by a reducing (see Figure 9).…”
Section: Passivation Qualitymentioning
confidence: 99%