2009
DOI: 10.1016/j.jallcom.2009.05.036
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HREM studies of twins in Cd1−xZnxTe (x≈0.04) thin films grown by molecular beam epitaxy

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Cited by 15 publications
(6 citation statements)
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References 27 publications
(34 reference statements)
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“…From rocking curve data, we already knew that untwinned material existed after the flip to the twinned orientation, but these measurements provided no information on the scale or nature of the defects. The X-ray diffraction imaging results are consistent with the observation by high resolution electron microscopy that the predominant defect in Cd 1-x Zn x Te thin films are lamellar twins and that they occur at high density [30].…”
Section: Discussionsupporting
confidence: 86%
“…From rocking curve data, we already knew that untwinned material existed after the flip to the twinned orientation, but these measurements provided no information on the scale or nature of the defects. The X-ray diffraction imaging results are consistent with the observation by high resolution electron microscopy that the predominant defect in Cd 1-x Zn x Te thin films are lamellar twins and that they occur at high density [30].…”
Section: Discussionsupporting
confidence: 86%
“…Alikhanian et al have reported the first experimental investigation of the solid-vapor equilibrium in the CdTe-ZnTe system at 525 • C and 505 • C over the whole composition range [13]. The micro structural defects of MBE deposited Cd 1−x Zn x Te thin films with x ≈ 0.04 using HRTEM have been reported by different authors [14].…”
Section: Introductionmentioning
confidence: 94%
“…However, several studies describe the data from electron diffraction patterns that were initially assigned to 2H-Si as a double diffraction of superposed twinned crystals. Moreover, the Raman peak shifts toward the expected value for the 2H-Si can be caused by defects and therefore are not necessarily a clear evidence for the presence of the metastable Si allotrope . Nevertheless, several reports describe the presence of 2H-Si using characterization methods capable of an unequivocal identification. , For instance, it is highly recommended/vital to use the [110] 3C /[12̅10] 2H zone axis to distinguish between double diffraction caused by twins and 2H-Si when using HRTEM/electron diffraction for the characterization .…”
Section: Metastable Group IV Nanostructuresmentioning
confidence: 99%