1983
DOI: 10.1016/0167-9317(83)90025-4
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High voltage electron beam lithography

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Cited by 18 publications
(10 citation statements)
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“…2c) and dense (Fig. 2d) pixel arrays, the EBL proximity effect 28 leads to variation in the final thickness values and hence spectral response for an identical dose range. We therefore determined an empirical correction (decrease) to the dose range in order to achieve the desired spectral response for dense pixel arrays (see Supplementary Note 2.2).…”
Section: Resultsmentioning
confidence: 96%
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“…2c) and dense (Fig. 2d) pixel arrays, the EBL proximity effect 28 leads to variation in the final thickness values and hence spectral response for an identical dose range. We therefore determined an empirical correction (decrease) to the dose range in order to achieve the desired spectral response for dense pixel arrays (see Supplementary Note 2.2).…”
Section: Resultsmentioning
confidence: 96%
“…Transmission of up to ∼75% and relatively narrow full widths at half maximum (fwhm's) of ∼50 nm are observed in Figure 2b (i), with Δz thickness values up to ∼150 nm (Figure 2b, (ii)), in agreement with the simulation results (Figure 2a and Two different dose-modulated MIM arrays were then fabricated, clearly achieving varying colors as a result of variations in the cavity height. For isolated (Figure 2c) and dense (Figure 2d) pixel arrays, the EBL proximity effect 39 leads to variation in the final thickness values and hence spectral response for an identical dose range. We therefore determined an empirical correction (decrease) to the dose range in order to achieve the desired spectral response for dense pixel arrays (see SI Section S2 and Figures S6 and S7).…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…High-energy (EBL) offers a range of advantages over low-energy systems, including proximity effect reduction, vertical resist sidewalls and dimension accuracy over rough surfaces [7,8]. Nanofabrication on insulating substrates using high energy EBL can be challenging due to several key factors.…”
Section: Introductionmentioning
confidence: 99%
“…Nanofabrication on insulating substrates using high energy EBL can be challenging due to several key factors. These include increased electron back scattering; insufficient charge dissipation; large area dose required for exposing conventional high resolution e-beam resists (such as poly(methyl methacrylate) (PMMA) / hydrogen silsesquioxane (HSQ) / ZEP-series) at high EBL acceleration voltages; and inevitably a large beam current in order to pattern with acceptable throughput [7][8][9][10][11][12][13][14][15][16]. Workarounds include depositing an ultra-thin metallic layer either above or below the resist or using a conductive polymer; both methods are used to dissipate the built-up charge during exposure [10,[17][18][19][20].…”
Section: Introductionmentioning
confidence: 99%
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